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45752	Introduction to analytical electron microscopy		  	edited by John J. Hren, Joseph I. Goldstein, and David C. Joy	63874	Hren, John J.//Goldstein, Joseph//Joy, David C.//Electron Microscopy Society of America//Microbeam Analysis Society. Conference	""	Plenum Press		1979	1979		2000-12-26 03:14:01 +0900	2025-12-15 09:30:14 +0900	volume	text	unknown	English	9780306402807	""			BA07286903										xv, 601 p. ; 27 cm	1	601		25.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	537.533.3	2344	524741		537.533.||04377	namiki	N00090303			1982-07-06 00:00:00 +0900	2010-12-15 20:24:31 +0900	2025-12-15 09:30:14 +0900
77060	Physical aspects of electron microscopy and microbeam analysis		  	edited by Benjamin M. Siegel and D. R. Beaman	25842	Siegel, Benjamin M.//Electron Microscopy Society of America//Beaman, Donald Robert//Microbeam Analysis Society	edited by Benjamin M. Siegel, Donald R. Beaman	Wiley		1975			1901-01-01 09:00:00 +0900	2025-12-15 09:44:29 +0900	volume	text	unknown	English	9780471790204	""			BA07555186										xiii, 474 p. ; 26 cm	1	474		27.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833	43579	205664		621.385.833|S|5820	namiki	N00220403			1976-12-10 00:00:00 +0900	2010-12-15 23:51:41 +0900	2025-12-15 09:44:29 +0900