manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	manifestation_identifier	creator	contributor	publisher	date_of_publication	pub_date	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	doi	jpno	ncid	lccn	iss_itemno	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
38370	IITRI fracture handbook : failure analysis of metallic materials by scanning electron microscopy		  	edited by S. Bhattacharyya ... [et al.]	31789	IIT Research Institute. Metals Research Division//Bhattacharyya, S. P. (Shankar P.)	edited by S. Bhattacharyya [et al.]	Metals Research Division, IIT Research Institute		1979			1999-05-18 22:53:00 +0900	2025-12-23 15:16:08 +0900	volume	text	unknown	English	9780915802111	""			BA14037716										xxx, 427, [141] p. ; 29 cm	1	150		29.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	39351	215542		620.18|Ｂ|	sengen	S10070206			1981-03-17 00:00:00 +0900	2010-12-15 23:31:28 +0900	2025-12-23 15:16:08 +0900
30052	Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists	""	  	Joseph I. Goldstein ... [et al.]	33688	Goldstein, Joseph,	""	Plenum Press		1992	1992		1901-12-31 09:00:00 +0900	2026-01-14 09:29:54 +0900	volume	text	unknown	English	9780306441752	""			BA18374139					2	2nd ed				xviii, 820 p. ; 26 cm	1	820		0.0	0.0	0.0			Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833	41965	217474		621.385.833|G|10373	namiki	N00220305	""		1997-08-05 00:00:00 +0900	2010-12-15 23:44:06 +0900	2026-01-14 09:29:54 +0900
42080	Scanning electron microscopy/1976	SEM	  		25830	Johari, Om//IIT Research Institute//Becker, Robert P.	edited by Om Johari	IIT Research Institute		1976	1976		1901-01-01 09:00:00 +0900	2025-12-15 09:44:27 +0900	volume	text	unknown	English	9780915802098	05865581			BA72401893			1	Vol. 1						1 v. ; 29 cm	1	782		29.0					Guest			""	""	""	""	""	""	""	""	""	""	22296	Scanning electron microscopy	""	""	""	""	""	""	""	42080	977	""	2012-02-02 10:20:33 +0900	2025-07-11 15:05:59 +0900	""	""	""	""	""	621.385.833	43684	205652		621.385.|Ｊ|5851	namiki	N00220402			1977-02-10 00:00:00 +0900	2010-12-15 23:52:10 +0900	2025-12-15 09:44:27 +0900
42081	Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois	SEM	  	edited by Om Johari ; sponsored by IIT research Institute	25832	Scanning Electron Microscope Symposium//Johari, Om//IIT Research Institute	edited by Om Johari	IIT Research Institute		1977			1901-01-01 09:00:00 +0900	2025-12-15 09:44:28 +0900	volume	text	unknown	English	9780915802111	""			BA22283161			1	Vol. 1						xvi, 783 p. ; 29 cm	1	784		28.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833	43685	205654		621.385.|J|6184	namiki	N00220402			1978-05-29 00:00:00 +0900	2010-12-15 23:52:11 +0900	2025-12-15 09:44:28 +0900
42083	Scanning electron microscopy 1968 : proceedings of the Symposium on the Scanning Electron Microscope -- the instrument and its applications, held at IIT Research Institute, Chicago, Illnois, USA, April 30-May 1, 1968		  		25829	Scanning Electron Microscope Symposium//IIT Research Institute	edited by Om Johari	IIT Research Institute		1968			1901-01-01 09:00:00 +0900	2025-12-15 09:44:27 +0900	volume	text	unknown	English	""	""			BA10178738										viii, 185 p. ; 29 cm	1	185		28.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833	43687	205651		621.385.|J|3865	namiki	N00220402			1970-05-25 00:00:00 +0900	2010-12-15 23:52:11 +0900	2025-12-15 09:44:27 +0900