manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 42605 Characterisation of radiation damage by transmission electron microscopy M.L. Jenkins, M.A. Kirk 67494 Jenkins, M. L.//Kirk, M. A. "" Institute of Physics Pub. 2001 2002-01-30 02:08:45 +0900 2025-12-15 09:44:25 +0900 volume text unknown English 9780750307482 "" BA53960344 x, 224 p. ; 25 cm 1 224 24.0 Guest "" "" "" "" "" "" "" "" "" "" 69425 Microscopy in materials science series "" "" "" "" "" "" "" 42605 16380 "" 2024-11-28 21:36:37 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 44311 219114 621.385.|J|11641 namiki N00220402 2002-02-07 00:00:00 +0900 2010-12-15 23:55:44 +0900 2025-12-15 09:44:25 +0900 41849 Transmission electron microscopy and diffractometry of materials Brent Fultz, James Howe 65616 Fultz, B.//Howe, James M. "" Springer 2001 2001-07-04 00:58:16 +0900 2025-12-15 09:44:24 +0900 volume text unknown English 9783540678410 "" BA50935635 xix, 748 p. ; 24 cm 1 748 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43447 218843 621.385.833|F|11478 namiki N00220305 2001-06-27 00:00:00 +0900 2010-12-15 23:51:04 +0900 2025-12-15 09:44:23 +0900 4792 Introduction to scanning tunneling microscopy Oxford Series in Optical and Imaging Sciences 4 (Introduction to Scanning Tunneling Microscopy) C. Julian Chen 64593 Chen, C. Julian "" Oxford University Press 1993 1993 2000-12-26 03:48:23 +0900 2025-12-15 09:44:22 +0900 volume text unknown English "" "" BA20444419 xxii, [32], 412 p. ; 24 cm 1 412 23.0 Guest "" "" "" "" "" "" "" "" "" "" 65223 Oxford series in optical and imaging sciences "" "" "" "" 4 "" "" 4792 12459 "" 2024-11-28 20:54:18 +0900 2025-11-13 10:48:20 +0900 "" "" "" "" "" 621.385.833 5193 527878 621.385.||05106 namiki N00220305 1993-07-27 00:00:00 +0900 2010-12-15 20:38:41 +0900 2025-12-15 09:44:22 +0900 4563 Springer Series in Optical Sciences Volume 45 (Scanning Electron Microscopy) Springer Series in Optical Sciences Volume 45 (Scanning Electron Microscopy) 64872 Reimer.L.' "" Springer 1998-01-01 00:00:00 +0900 1998-01-01 1998 2000-12-26 03:42:50 +0900 2025-12-15 09:44:22 +0900 volume text unknown English "" "" 527p; 24cm 1 527 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 4901 527891 621.385.||05395 namiki N00220304 1998-11-13 00:00:00 +0900 2010-12-15 20:37:06 +0900 2025-12-15 09:44:22 +0900 4421 Principles and basic properties Advanced Light Microscopy.Vol.1 (Vol.1:-Principles and Basic Properties.) Maksymilian Pluta 64283 Pluta, Maksymilian "" Elsevier//Distribution for the USA and Canada, Elsevier Science Publishing Co 1988 1988 2000-12-26 03:40:28 +0900 2025-12-15 09:44:27 +0900 volume text unknown English 9780444989390 "" BA04379451 xix, 464 p. ; 25 cm 1 464 24.0 Guest "" "" "" "" "" "" "" "" "" "" 65222 Advanced light microscopy "" "" "" Maksymilian Pluta v. 1 "" "" 4421 12458 "" 2024-11-28 20:54:18 +0900 2025-11-13 10:48:20 +0900 "" "" "" "" "" 621.385.833 4769 527882 621.385.||04794 namiki N00220402 1989-09-26 00:00:00 +0900 2010-12-15 20:36:23 +0900 2025-12-15 09:44:27 +0900 4332 Specialized methods Advanced Light Microscopy.Vol.2 (Vol.2:-Specialized Methods.) Maksymilian Pluta 64284 Pluta, Maksymilian "" Elsevier//PWN-Polish Scientific publishers 1989 1989 2000-12-26 03:38:43 +0900 2025-12-15 09:44:28 +0900 volume text unknown English 9780444989185 "" BA07013955 xiii, 494 p. ; 25 cm 1 494 24.0 Guest "" "" "" "" "" "" "" "" "" "" 65221 Advanced light microscopy "" "" "" Maksymilian Pluta v. 2 "" "" 4332 12457 "" 2024-11-28 20:54:18 +0900 2025-11-13 10:48:20 +0900 "" "" "" "" "" 621.385.833 4670 527883 621.385.||04795 namiki N00220402 1989-09-26 00:00:00 +0900 2010-12-15 20:35:51 +0900 2025-12-15 09:44:28 +0900 3344 Practical scanning electron microscopy : electron and ion microprobe analysis edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart 62913 Goldstein, Joseph//Yakowitz, Harvey "" Plenum Press 1975 1975 2000-12-26 03:25:06 +0900 2025-12-15 09:44:24 +0900 volume text unknown English 9780306308208 "" BA03242622 xviii, 582 p. ; 24 cm 1 582 23.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 3604 527900 621.385.||03410 namiki N00220305 1976-02-24 00:00:00 +0900 2010-12-15 20:30:31 +0900 2025-12-15 09:44:24 +0900 2582 New direction in transmission electron microscopy and nano-characterization of materials : proceedings of the Asian science seminar in commemoration of the the 20th anniversary of the HVEM Laboratory of Kyushu University New Direction in Transmission Electron Microscopy and Nano-characterization of Materials edited by Chiken Kinoshita, Yoshitsugu Tomokiyo, Syo Matsumura 64873 木下, 智見//The Asian Science Seminar in commemoration of the the 20th anniversary of the HVEM Laboratory of Kyushu University "" Kyushu University Press 1998 1998 2000-12-26 03:17:45 +0900 2025-12-15 09:44:21 +0900 volume text unknown English 9784873785585 "" BA37759582 xi, 392 p. ; 27 cm 1 392 26.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 2751 527905 621.385.||05396 namiki N00220304 1998-11-13 00:00:00 +0900 2010-12-15 20:26:31 +0900 2025-12-15 09:44:21 +0900 2570 Advanced scanning electron microscopy and X-ray microanalysis Advanced Scanning Electron Microscopy and X-Ray Microanalysis Dale E. Newbury ... [et al.] 64857 Newbury, Dale E. "" Plenum Press 1986 1986 2000-12-26 03:17:36 +0900 2025-12-15 09:44:27 +0900 volume text unknown English "" "" BA00238640 xii, 454 p. ; 24 cm 1 454 23.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 2736 527868 621.385.||05379 namiki N00220402 1998-09-01 00:00:00 +0900 2010-12-15 20:26:27 +0900 2025-12-15 09:44:27 +0900 2185 The chemical applications of transmission electron microscopy J. R. Fryer 63664 Fryer, J. R. "" Academic Press 1979 1979 2000-12-26 03:13:29 +0900 2025-12-15 09:44:23 +0900 volume text unknown English 9780122693502 "" BA23084014 x, 286 p. ; 24 cm 1 286 23.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 2288 527901 621.385.||04167 namiki N00220305 1980-06-10 00:00:00 +0900 2010-12-15 20:24:13 +0900 2025-12-15 09:44:23 +0900