manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 71781 Convergent-beam electron diffraction by Michiyoshi Tanaka, Masami Terauchi 31706 田中, 通義//寺内, 正巳 "" JEOL 1985 1999-05-19 08:57:13 +0900 2025-12-15 09:44:30 +0900 volume text unknown English "" "" BA01129888 vi, 192 p. ; 29 cm 1 192 29.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 38239 215459 621.385.833|Ｔ|T-771 namiki N00220403 1987-09-04 00:00:00 +0900 2010-12-15 23:25:35 +0900 2025-12-15 09:44:30 +0900 34844 Electron Microscopy 1982 Vol.2 Electron Microscopy 1982 2 27617 The Congress Organizing Committee "" Deutsche Gesellschaft Elektronenj-Mikroskopie E. V. 1982-01-01 00:00:00 +0900 1982-01-01 1999-05-19 08:17:23 +0900 2025-12-15 09:44:22 +0900 volume text unknown English "" "" 600p; 22cm 1 600 22.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 35441 207678 621.385.|Ｅｌ|８３３ namiki N00220305 1985-10-08 00:00:00 +0900 2010-12-15 23:11:51 +0900 2025-12-15 09:44:22 +0900 67698 Symposia and physical sciences : paper presented at the 10th International Congress on Electron Microscopy held in Hamburg, West Germany, August 17-24, 1982 "" editor, the Congress Organizing Committee 27616 International Congress on Electron Microscopy "" Deutsche Gesellschaft für Elektronenmikroskopie 1982 1982 1999-05-19 08:17:22 +0900 2025-12-15 09:44:22 +0900 volume text unknown English "" "" BA01016440 761 p. ; 22 cm 1 761 22.0 Guest "" "" "" "" "" "" "" "" "" "" 69418 Electron microscopy, 1982 : paper presented at the 10th International Congress on Electron Microscopy held in Hamburg, West Germany, August 17-24, 1982 "" editor, The Congress Organizing Committee "" "" v. 1 "" "" 67698 16373 "" 2024-11-28 21:36:30 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 35440 207677 621.385.833|C|7729 namiki N00220305 "" 1985-10-08 00:00:00 +0900 2010-12-15 23:11:50 +0900 2025-12-15 09:44:22 +0900 37164 Developments in electron microscopy and analysis : proceedings of EMAG 75 held at the University of Bristol, 8-11 September 1975 edited and introduced by J. A. Venables 25841 Venables, J. A.//Institute of Physics (Great Britain). Electron Microscopy and Analysis Group "" Academic Press 1976 1999-05-19 08:00:43 +0900 2025-12-15 09:44:30 +0900 volume text unknown English 9780127169507 "" BA06284968 xxviii, 537 p. ; 27 cm 1 537 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 34142 205663 621.385.833|Ｖ|5861 namiki N00220403 1977-02-18 00:00:00 +0900 2010-12-15 23:05:44 +0900 2025-12-15 09:44:30 +0900 33718 Electron Microscope Fracture Examination to Characterize & Identify Modes of Fracture Electron Microscope Fracture Examination to Characterize & Identify Modes of Fracture 25818 C. D. Beachem "" U. S. Naval Research Laboratory 1993-01-01 00:00:00 +0900 1993-01-01 1999-05-19 08:00:11 +0900 2025-12-15 09:44:24 +0900 volume text unknown English "" "" 1 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 34100 205640 621.385.|Ｅｌ|８３３ namiki N00220305 1966-06-06 00:00:00 +0900 2010-12-15 23:05:32 +0900 2025-12-15 09:44:24 +0900 31504 Handbook of microscopy : applications in materials science, solid-state physics and chemistry edited by S.Amelinckx ... [et al.] 33794 Amelinckx, Severin edited by S. Amelinckx, D.van Dyck, J.van Landuyt, G. Van Tendeloo VCH 1997 1999-05-19 04:40:00 +0900 2025-12-23 15:17:42 +0900 volume text unknown English 9783527294732 "" BA2929444X 2 Methods 2 1 v. ; 25 cm 1 539 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 39703 217580 621.385.833|Ａ|10462 sengen S10080206 1998-01-23 00:00:00 +0900 2010-12-15 23:33:29 +0900 2025-12-23 15:17:42 +0900 31505 Handbook of microscopy : applications in materials science, solid-state physics and chemistry edited by S.Amelinckx ... [et al.] 33793 Amelinckx, Severin edited by S. Amelinckx, D.van Dyck, J.van Landuyt, G.Van Tendeloo VCH 1997 1999-05-19 04:39:00 +0900 2025-12-23 15:17:14 +0900 volume text unknown English 9783527292806 "" BA2929444X 1 Methods 1 1 v. ; 25 cm 1 1 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 39702 217579 621.385.833|Ａ|10461 sengen S10080206 1998-01-23 00:00:00 +0900 2010-12-15 23:33:29 +0900 2025-12-23 15:17:14 +0900 38369 Handbook of microscopy : applications in materials science, solid-state physics and chemistry edited by S.Amelinckx ... [et al.] 33795 Amelinckx, Severin edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo VCH 1997 1999-05-18 22:52:00 +0900 2025-12-23 15:16:09 +0900 volume text unknown English 9783527292936 "" BA2929444X Applications 1 v. ; 25 cm 1 833 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 39350 217581 621.385.833|Ａ|10463 sengen S10080206 1998-01-23 00:00:00 +0900 2010-12-15 23:31:28 +0900 2025-12-23 15:16:09 +0900 45995 Principles of analytical electron microscopy edited by David C. Joy, Alton D. Romig, Jr. and Joseph I. Goldstein 31762 Joy, David C.//Romig, Alton D.//Goldstein, Joseph edited by David C. Joy, Alton D. Romig, Jr. and Joseph I. Goldstein Plenum Press 1986 1999-05-18 20:49:00 +0900 2025-12-15 09:44:25 +0900 volume text unknown English 9780306423871 "" BA00591396 xvi, 448 p. ; 26 cm 1 448 26.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 39228 215515 621.385.833|J|T-963 namiki N00220402 1988-03-14 00:00:00 +0900 2010-12-15 23:30:48 +0900 2025-12-15 09:44:25 +0900 30052 Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists "" Joseph I. Goldstein ... [et al.] 33688 Goldstein, Joseph, "" Plenum Press 1992 1992 1901-12-31 09:00:00 +0900 2026-01-23 15:54:39 +0900 volume text unknown English 9780306441752 "" BA18374139 2 2nd ed xviii, 820 p. ; 26 cm 1 820 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 41965 217474 621.385.833|G|10373 namiki N00220305 "" 1997-08-05 00:00:00 +0900 2010-12-15 23:44:06 +0900 2026-01-23 15:54:39 +0900