manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 37602 Gettering and deffect engineering in semiconductor technology : GADEST '93 : proceedings of the 5th International Autumn Meeting held in Chossewitz, near Frankfurt(Oder), Germany, October 09-14, 1993 Diffusion & Defect Data pt.B 32-33 editors, H.G. Grimmeiss, M. Kittler and H. Richter 32646 International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology//Grimmeiss, H. G.//Kittler, M.//Richter, H. "" SciTec Publications 1993 1901-12-31 09:00:00 +0900 2025-12-15 09:52:43 +0900 volume text unknown English 9783908450009 "" BA21152678 xvii, 630 p. ; 25 cm 1 630 25.0 Guest "" "" "" "" "" "" "" "" "" "" 68541 Diffusion and defect data : solid state data "" "" "" "" Pt. B . Solid state phenomena ; v. 32 & 33 "" "" 37602 15495 "" 2024-11-28 21:25:39 +0900 2026-04-07 11:43:58 +0900 "" "" "" "" "" 548.526 38489 216431 548.526|| namiki N10080107 1993-12-09 00:00:00 +0900 2010-12-15 23:26:55 +0900 2025-12-15 09:52:43 +0900 37603 Standardization of fretting fatigue test methods and equipment Fretting fatigue test methods and equipment M. Helmi Attia and R.B. Waterhouse, editors 32649 Attia, M. Helmi (Mahmoud Helmi)//Waterhouse, R. B. (Robert Barry) "" ASTM 1992 1901-12-31 09:00:00 +0900 2025-12-23 15:16:07 +0900 volume text unknown English 9780803114487 "" BA18549684 281 p. ; 24 cm 1 281 24.0 18477 Guest "" "" "" "" "" "" "" "" "" "" 72258 ASTM special technical publication "" "" "" "" 1159 "" "" 37603 19191 "" 2024-11-28 22:08:28 +0900 2026-04-07 11:43:58 +0900 "" "" "" "" "" STP 38490 216434 STP|A|T-1499 sengen S10120106 1994-08-23 00:00:00 +0900 2010-12-15 23:26:56 +0900 2025-12-23 15:16:07 +0900 37605 Diffusion and Defect Data Pt.A Defect and Diffusion Forum Vol.152 Vol.152 with Annual Index 33807 "" "" Scitec Publications 1901-12-31 09:00:00 +0900 2025-12-15 09:52:36 +0900 volume text unknown English "" "" 264p; 25cm 1 264 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.526 38494 217593 548.526|Ｄ|10475 namiki N10080105 1998-01-26 00:00:00 +0900 2010-12-15 23:26:57 +0900 2025-12-15 09:52:36 +0900 39676 Computerization and networking of materials databases Satoshi Nishijima and Shuichi Iwata, editors 33697 Nishijima, Satoshi//Iwata, Shuichi "" ASTM 1997 1997 1901-12-31 09:00:00 +0900 2025-12-23 15:16:12 +0900 volume text unknown English 9780803124196 "" BA19171046 5 v. 5 1 v. ; 24 cm 1 282 24.0 Guest "" "" "" "" "" "" "" "" "" "" 72263 ASTM special technical publication "" "" "" "" 1311 "" "" 39676 19196 "" 2024-11-28 22:08:30 +0900 2026-04-07 11:43:58 +0900 "" "" "" "" "" STP 40812 217483 STP|A|ｷ780 sengen S10120106 1997-08-04 00:00:00 +0900 2010-12-15 23:38:42 +0900 2025-12-23 15:16:12 +0900 39531 Beam injection assessment of defects in semiconductors : proceedings of the 5th workshop on beam injection assessment of defects in semiconductors held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30-September 3, 1998 editors. M. Kittler, O. Breitenstein, A. Endros and W. Schroter 34197 Kittler, M.//Breitenstein, O. "" Scitec Publications Ltd. 1998 1998 1901-12-31 09:00:00 +0900 2025-12-15 09:52:44 +0900 volume text unknown English 9783908450399 10120394 BA46349537 xiv, 537 p. ; 25 cm 1 537 25.0 Guest "" "" "" "" "" "" "" "" "" "" 68557 Diffusion and defect data : solid state data "" "" "" "" Pt. B. Solid state phenomena ; v. 63 & 64 "" "" 39531 15511 "" 2024-11-28 21:25:47 +0900 2026-04-07 11:43:58 +0900 "" "" "" "" "" 548.526 40677 217984 548.526|Ｄ|10776 namiki N10080107 1999-02-17 00:00:00 +0900 2010-12-15 23:38:04 +0900 2025-12-15 09:52:44 +0900 39905 The world of learning The Europa world of learning 20991 "" "" Europa Publications 1989 1989 1901-12-31 09:00:00 +0900 2025-11-06 11:46:00 +0900 volume text unknown English 9780946653546 00842117 BA00142439 40 40th ed. : 1990 1 v. ; 29 cm 1 1964 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 061 41107 200384 061|Ｗ|8893 sengen S10030203 1990-03-12 00:00:00 +0900 2010-12-15 23:40:05 +0900 2025-11-06 11:46:00 +0900 39706 X-Ray analysis of crystals Röntgenanalyse van Krystallen by J.M. Bijvoet, N.H. Kolkmeyer, Caroline H. Macgillavry ; based on a translation by H. Littman Furth 29601 Bijvoet, Johannes Martin//Kolkmeyer, N. H.//MacGillavry, Caroline H.//Furth, Littman H. "" Butterworths Scientific Publications//Interscience 1951-01-01 00:00:00 +0900 1951 1951 "" 1901-12-31 09:00:00 +0900 2026-03-11 14:42:04 +0900 volume text unknown English "" "" BA18721946 "" "" "" xii, 304 p., [1] folded leaf of plates ; 26 cm 1 304 26.0 "" Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.73 40877 209711 548.73|B|533 namiki N00180403 "" 1958-01-28 00:00:00 +0900 2010-12-15 23:39:00 +0900 2026-03-11 14:41:51 +0900 39966 Manual on low cycle fatigue testing 30724 American Society for Testing and Materials "" ASTM 1969 1969 1901-12-31 09:00:00 +0900 2025-12-23 15:15:07 +0900 volume text unknown English 9780803100237 "" BA02976427 ix, 193 p. ; 24 cm 1 193 24.0 Guest "" "" "" "" "" "" "" "" "" "" 72138 ASTM special technical publication "" "" "" "" 465 "" "" 39966 19072 "" 2024-11-28 22:07:45 +0900 2026-04-07 11:43:58 +0900 "" "" "" "" "" STP 41193 212664 STP|A|ｷ 409 sengen S10120103 1992-12-15 00:00:00 +0900 2010-12-15 23:40:29 +0900 2025-12-23 15:15:07 +0900 39836 Zirconium by G.L. Miller 24386 Miller, George Leslie "" Butterworths Scientific Publications 1954 1901-12-31 09:00:00 +0900 2026-03-19 14:01:59 +0900 volume text unknown English "" "" BA45064167 xviii, 382 p. ; 23 cm 1 382 23.0 Guest "" "" "" "" "" "" "" "" "" "" 70386 Metallurgy of the rarer metals "" "" "" "" 2 "" "" 39836 17323 "" 2024-11-28 21:49:46 +0900 2026-04-07 11:43:58 +0900 "" "" "" "" "" 669.296 41019 204202 669.296|M|239 namiki N00270205 "" 1957-06-20 00:00:00 +0900 2010-12-15 23:39:40 +0900 2026-03-19 14:01:59 +0900 34804 Hierarchical structures in biology as a guide for new materials technology Committee on Synthetic Hierarchical Structures, National Materials Advisory Board, Commission on Engineering and Technical Systems, National Research Council 34117 National Research Council (U.S.). Committee on Synthetic Hierarchical Structures "" National Academy Press 1994 1901-01-01 09:00:00 +0900 2025-12-15 09:42:09 +0900 volume text unknown English 9780309046381 "" BA57747542 xii, 130 p. ; 23 cm 1 130 23.0 Guest "" "" "" "" "" "" "" "" "" "" 68953 Publication NMAB "" "" "" "" 464 "" "" 34804 15905 "" 2024-11-28 21:31:31 +0900 2026-04-07 11:43:58 +0900 "" "" "" "" "" 620.22 43092 217904 620.22|C|10698 namiki N00210102 1998-11-20 00:00:00 +0900 2010-12-15 23:49:23 +0900 2025-12-15 09:42:09 +0900