manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	manifestation_identifier	creator	contributor	publisher	date_of_publication	pub_date	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	doi	jpno	ncid	lccn	iss_itemno	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
1359	Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials		  		61891	American Society for Testing and Materials. Subcommittee II on Fractography	""	American Society for Testing and Materials		1969	1968		2000-12-26 03:06:13 +0900	2025-12-15 09:31:18 +0900	volume	text	unknown	English	9780803100138	""			BA02975967										v, 235 p. ; 24 cm	1	235		23.0					Guest			""	""	""	""	""	""	""	""	""	""	63046	ASTM special technical publication	""	""	""	""	453	""	""	1359	10446	""	2024-11-28 20:33:55 +0900	2025-11-13 10:48:20 +0900	""	""	""	""	""	539	1452	525017		539||02368	namiki	N00100206			1973-02-02 00:00:00 +0900	2010-12-15 20:19:32 +0900	2025-12-15 09:31:18 +0900
1358	Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970		  		61890	Symposium on Applications of Electron Microfractography to Materials Research//American Society for Testing and Materials. Subcommittee II on Fractography	""	American Society for Testing and Materials		1971	1970		2000-12-26 03:06:12 +0900	2025-12-15 09:44:03 +0900	volume	text	unknown	English	""	""			BA02962433										96 p. ; 23 cm	1	96		23.0					Guest			""	""	""	""	""	""	""	""	""	""	65186	ASTM special technical publication	""	""	""	""	493	""	""	1358	12423	""	2024-11-28 20:53:52 +0900	2025-11-13 10:48:20 +0900	""	""	""	""	""	621.38	1451	527853		621.38||02367	namiki	N00220204			1973-02-02 00:00:00 +0900	2010-12-15 20:19:31 +0900	2025-12-15 09:44:03 +0900