manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	manifestation_identifier	creator	contributor	publisher	date_of_publication	pub_date	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	doi	jpno	ncid	lccn	iss_itemno	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
40991	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995	Defects in semiconductors 18	  	edited by Masashi Suezawa and Hiroshi Katayama-Yoshida	68197	International Conference on Defects in Semiconductors//Suezawa, Masashi//Katayama-Yoshida, Hiroshi	edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida	Trans Tech Publications		1995	1995		2002-09-04 23:49:53 +0900	2025-12-15 09:43:48 +0900	volume	text	unknown	English	9780878497157	""			BA27177886			4	pt. 4						1 v. ; 25 cm	1	1563		25.0					Guest			""	""	""	""	""	""	""	""	""	""	69341	Materials science forum	""	""	""	""	v. 196-201	""	""	40991	16297	""	2024-11-28 21:35:28 +0900	2025-11-28 13:04:07 +0900	""	""	""	""	""	621.315.592	42418	219286		621.315.|D|ｷ1200	namiki	N00220104			2002-07-08 00:00:00 +0900	2010-12-15 23:46:13 +0900	2025-12-15 09:43:48 +0900
43354	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995	Defects in semiconductors 18	  	edited by Masashi Suezawa and Hiroshi Katayama-Yoshida	68196	International Conference on Defects in Semiconductors//Suezawa, Masashi//Katayama-Yoshida, Hiroshi	edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida	Trans Tech Publications		1995	1995		2002-09-04 23:44:53 +0900	2025-12-15 09:43:47 +0900	volume	text	unknown	English	9780878497140	""			BA27177886			3	pt. 3						1 v. ; 25 cm	1	1109		25.0					Guest			""	""	""	""	""	""	""	""	""	""	69345	Materials science forum	""	""	""	""	v. 196-201	""	""	43354	16301	""	2024-11-28 21:35:30 +0900	2025-11-28 13:04:07 +0900	""	""	""	""	""	621.315.592	45178	219285		621.315.|D|ｷ1199	namiki	N00220104			2002-07-08 00:00:00 +0900	2010-12-16 00:00:53 +0900	2025-12-15 09:43:47 +0900
40989	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995	Defects in semiconductors 18	  	edited by Masashi Suezawa and Hiroshi Katayama-Yoshida	68194	International Conference on Defects in Semiconductors//Suezawa, Masashi//Katayama-Yoshida, Hiroshi	edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida	Trans Tech Publications		1995	1995		2002-09-04 23:28:13 +0900	2025-12-15 09:43:49 +0900	volume	text	unknown	English	9780878497126	""			BA27177886			1	pt. 1						1 v. ; 25 cm	1	1		25.0					Guest			""	""	""	""	""	""	""	""	""	""	69339	Materials science forum	""	""	""	""	v. 196-201	""	""	40989	16295	""	2024-11-28 21:35:28 +0900	2025-11-28 13:04:07 +0900	""	""	""	""	""	621.315.592	42416	219283		621.315.|D|ｷ1197	namiki	N00220104			2002-07-08 00:00:00 +0900	2010-12-15 23:46:13 +0900	2025-12-15 09:43:49 +0900
40990	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995	Defects in semiconductors 18	  	edited by Masashi Suezawa and Hiroshi Katayama-Yoshida	68192	International Conference on Defects in Semiconductors//Suezawa, Masashi//Katayama-Yoshida, Hiroshi	edited by;Masashi Suezawa and Hiroshi Katayama-Yoshida	Trans Tech Publications		1995	1995		2002-09-04 23:13:10 +0900	2025-12-15 09:43:47 +0900	volume	text	unknown	English	9780878497133	""			BA27177886			2	pt. 2						1 v. ; 25 cm	1	579		25.0					Guest			""	""	""	""	""	""	""	""	""	""	69340	Materials science forum	""	""	""	""	v. 196-201	""	""	40990	16296	""	2024-11-28 21:35:28 +0900	2025-11-28 13:04:07 +0900	""	""	""	""	""	621.315.592	42417	219284		621.315.|D|ｷ1198	namiki	N00220104			2002-07-08 00:00:00 +0900	2010-12-15 23:46:13 +0900	2025-12-15 09:43:47 +0900