manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 132416 Semiconductor material and device characterization "" "" Dieter K. Schroder Schroder, Dieter K. "" IEEE Press, Wiley-Interscience 2006-01-01 00:00:00 +0900 2006 2006 [S.l.],Hoboken, N.J. 2024-01-16 11:19:47 +0900 2025-12-15 09:43:49 +0900 volume unknown English 9780471739067 "" BA76086798 3 3rd ed. xv, 779 p. ; 25 cm Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.315.592 102900 602719 621.315.592|S| namiki N00220104 2016-01-21 00:00:00 +0900 2024-01-16 11:19:47 +0900 2025-12-15 09:43:49 +0900 77058 The 9th International Conference on Shallow-Level Centers in Semiconductors : proceedings of the Yamada Conference LIV, held in Awaji island, Hyogo, Japan, 24-27 September 2000 SLCS-9 guest editors, M. Suezawa, H. Nakata and H. Katayama-Yoshida 921142 International Conference on Shallow-Level Centers in Semiconductors "" Elsevier Science 2001 2001 2008-09-02 20:14:17 +0900 2025-12-15 09:43:48 +0900 volume text unknown English "" "" BA53872790 xi, 438 p. ; 27 cm 1 438 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.315.592 76495 211080 621.315.592|S|ｷ 1598 namiki N00220104 2008-03-05 00:00:00 +0900 2010-12-16 02:42:38 +0900 2025-12-15 09:43:48 +0900 76216 Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997 editors, Gordon Davies and Maria Helena Nazaré 921033 International Conference on Defects in Semiconductors//Davies, Gordon//Nazaré, Maria Helena "" Trans Tech Publications 1997 2008-05-20 21:11:30 +0900 2025-12-15 09:43:47 +0900 volume text unknown English 9780878497898 "" BA34772482 3 pt. 3 1 v. ; 25 cm 1 1293 25.0 Guest "" "" "" "" "" "" "" "" "" "" 69348 Materials science forum "" "" "" "" v. 258-263 "" "" 76216 16304 "" 2024-11-28 21:35:32 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.315.592 75820 211069 621.315.592|D|ｷ 1587 namiki N00220104 2008-03-05 00:00:00 +0900 2010-12-16 02:39:20 +0900 2025-12-15 09:43:47 +0900 76215 Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997 editors, Gordon Davies and Maria Helena Nazaré 921032 International Conference on Defects in Semiconductors//Davies, Gordon//Nazaré, Maria Helena "" Trans Tech Publications 1997 2008-05-20 21:09:50 +0900 2025-12-15 09:43:47 +0900 volume text unknown English 9780878497881 "" BA34772482 2 pt. 2 1 v. ; 25 cm 1 677 25.0 Guest "" "" "" "" "" "" "" "" "" "" 69347 Materials science forum "" "" "" "" v. 258-263 "" "" 76215 16303 "" 2024-11-28 21:35:32 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.315.592 75819 211068 621.315.592|D|ｷ 1586 namiki N00220104 2008-03-05 00:00:00 +0900 2010-12-16 02:39:20 +0900 2025-12-15 09:43:47 +0900 76214 Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997 editors, Gordon Davies and Maria Helena Nazaré 921031 International Conference on Defects in Semiconductors//Davies, Gordon//Nazaré, Maria Helena "" Trans Tech Publications 1997 2008-05-20 21:07:16 +0900 2025-12-15 09:43:47 +0900 volume text unknown English 9780878497874 "" BA34772482 1 pt. 1 1 v. ; 25 cm 1 1 25.0 Guest "" "" "" "" "" "" "" "" "" "" 69346 Materials science forum "" "" "" "" v. 258-263 "" "" 76214 16302 "" 2024-11-28 21:35:31 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.315.592 75818 211067 621.315.592|D|ｷ 1585 namiki N00220104 2008-03-05 00:00:00 +0900 2010-12-16 02:39:19 +0900 2025-12-15 09:43:47 +0900 40992 23rd International Conference on the Physics of Semiconductors Abstracts; ⅩⅩⅢICPS 1996 Berlin, Germany, Technische Univesitat Berlin July 21-26, 1996 68198 "" "" "" 2002-09-05 00:04:40 +0900 2025-12-15 09:43:48 +0900 volume text unknown English "" "" 21 1 21.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.315.592 42419 219279 621.315.||ｷ1193 namiki N00220104 2002-07-08 00:00:00 +0900 2010-12-15 23:46:13 +0900 2025-12-15 09:43:48 +0900 40991 Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Defects in semiconductors 18 edited by Masashi Suezawa and Hiroshi Katayama-Yoshida 68197 International Conference on Defects in Semiconductors//Suezawa, Masashi//Katayama-Yoshida, Hiroshi edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida Trans Tech Publications 1995 1995 2002-09-04 23:49:53 +0900 2025-12-15 09:43:48 +0900 volume text unknown English 9780878497157 "" BA27177886 4 pt. 4 1 v. ; 25 cm 1 1563 25.0 Guest "" "" "" "" "" "" "" "" "" "" 69341 Materials science forum "" "" "" "" v. 196-201 "" "" 40991 16297 "" 2024-11-28 21:35:28 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.315.592 42418 219286 621.315.|D|ｷ1200 namiki N00220104 2002-07-08 00:00:00 +0900 2010-12-15 23:46:13 +0900 2025-12-15 09:43:48 +0900 43354 Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Defects in semiconductors 18 edited by Masashi Suezawa and Hiroshi Katayama-Yoshida 68196 International Conference on Defects in Semiconductors//Suezawa, Masashi//Katayama-Yoshida, Hiroshi edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida Trans Tech Publications 1995 1995 2002-09-04 23:44:53 +0900 2025-12-15 09:43:47 +0900 volume text unknown English 9780878497140 "" BA27177886 3 pt. 3 1 v. ; 25 cm 1 1109 25.0 Guest "" "" "" "" "" "" "" "" "" "" 69345 Materials science forum "" "" "" "" v. 196-201 "" "" 43354 16301 "" 2024-11-28 21:35:30 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.315.592 45178 219285 621.315.|D|ｷ1199 namiki N00220104 2002-07-08 00:00:00 +0900 2010-12-16 00:00:53 +0900 2025-12-15 09:43:47 +0900 40989 Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Defects in semiconductors 18 edited by Masashi Suezawa and Hiroshi Katayama-Yoshida 68194 International Conference on Defects in Semiconductors//Suezawa, Masashi//Katayama-Yoshida, Hiroshi edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida Trans Tech Publications 1995 1995 2002-09-04 23:28:13 +0900 2025-12-15 09:43:49 +0900 volume text unknown English 9780878497126 "" BA27177886 1 pt. 1 1 v. ; 25 cm 1 1 25.0 Guest "" "" "" "" "" "" "" "" "" "" 69339 Materials science forum "" "" "" "" v. 196-201 "" "" 40989 16295 "" 2024-11-28 21:35:28 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.315.592 42416 219283 621.315.|D|ｷ1197 namiki N00220104 2002-07-08 00:00:00 +0900 2010-12-15 23:46:13 +0900 2025-12-15 09:43:49 +0900 40990 Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Defects in semiconductors 18 edited by Masashi Suezawa and Hiroshi Katayama-Yoshida 68192 International Conference on Defects in Semiconductors//Suezawa, Masashi//Katayama-Yoshida, Hiroshi edited by;Masashi Suezawa and Hiroshi Katayama-Yoshida Trans Tech Publications 1995 1995 2002-09-04 23:13:10 +0900 2025-12-15 09:43:47 +0900 volume text unknown English 9780878497133 "" BA27177886 2 pt. 2 1 v. ; 25 cm 1 579 25.0 Guest "" "" "" "" "" "" "" "" "" "" 69340 Materials science forum "" "" "" "" v. 196-201 "" "" 40990 16296 "" 2024-11-28 21:35:28 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.315.592 42417 219284 621.315.|D|ｷ1198 namiki N00220104 2002-07-08 00:00:00 +0900 2010-12-15 23:46:13 +0900 2025-12-15 09:43:47 +0900