manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	manifestation_identifier	creator	contributor	publisher	date_of_publication	pub_date	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	doi	jpno	ncid	lccn	iss_itemno	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
4291	Transmission electron microscopy : physics of image formation and microanalysis		Springer Series in Optical Science.Vol.36 (Vol.36:-Transmission Electron Microscopy Physics of Image Formation and Microalaysis.Second Edition) 	Ludwig Reimer	64281	Reimer, Ludwig	""	Springer-Verlag		1989	1989		2000-12-26 03:37:44 +0900	2025-12-15 09:45:53 +0900	volume	text	unknown	English	9783540504993	""			BA0701322X				: gw	2	2nd ed.				xiii, 547 p. ; 24 cm	1	547		23.0					Guest			""	""	""	""	""	""	""	""	""	""	65220	Springer series in optical sciences	""	""	""	""	v. 36	""	""	4291	12456	""	2024-11-28 20:54:17 +0900	2025-11-13 10:48:20 +0900	""	""	""	""	""	621.833	4615	527881		621.833||04792	namiki	N00230403			1989-08-18 00:00:00 +0900	2010-12-15 20:35:33 +0900	2025-12-15 09:45:53 +0900
76158	High-resolution transmission electron microscopy and associated techniques		  	editors, Peter R. Buseck, John M. Cowley, Leroy Eyring	64273	Buseck, Peter//Cowley, J. M. (John Maxwell)//Eyring, LeRoy	""	Oxford University Press		1988	1988		2000-12-26 03:15:31 +0900	2025-12-15 09:45:53 +0900	volume	text	unknown	English	9780195042757	""			BA06804864										xix, 645 p. ; 25 cm	1	645		23.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.833	2511	527908		621.833|B|	namiki	N00230403	""		1989-08-04 00:00:00 +0900	2010-12-15 20:25:23 +0900	2025-12-15 09:45:53 +0900
1730	High voltage electron microscopy : proceedings of the third International Conference		  	edited by P. R. Swann, C. J. Humphreys and M. J. Goringe	62664	International Conference on High Voltage Electron Microscopy//Swann, Peter Roland//Humphreys, Colin John//Goringe, M. J.	""	Academic Press		1974	1974		2000-12-26 03:09:33 +0900	2025-12-15 09:45:54 +0900	volume	text	unknown	English	""	""			BA06907459										xi, 475 p. ; 24 cm	1	475		23.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.833	1846	527903		621.833||03157	namiki	N00230403			1975-03-31 00:00:00 +0900	2010-12-15 20:21:46 +0900	2025-12-15 09:45:54 +0900
77079	Electron diffraction		  	[by] T. B. Rymer	62422	Rymer, T. B.	""	Methuen		1970	1970		2000-12-26 03:08:37 +0900	2025-12-15 09:45:53 +0900	volume	text	unknown	English	9780416076608	""			BA27091973										x, 165 p ; 23 cm	1	165		22.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.833	1736	527906		621.833||02916	namiki	N00230403			1974-06-28 00:00:00 +0900	2010-12-15 20:21:07 +0900	2025-12-15 09:45:53 +0900