manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 105475 Everything SAXS: Small-angle scattering pattern collection and correction "" "" "" 2015-12-15 21:32:23 +0900 2025-07-14 15:47:36 +0900 online_resource text unknown unknown "" "" https://hdl.handle.net/20.500.11932/1758219 Guest " For obtaining reliable nanostructural details of large amounts of sample --- and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique to use. It promises to obtain bulk-scale, statistically sound information on the morphological details of the nanostructure, and has thus led to many a researcher investing their time in it over the last eight decades of development. Due to pressure both from scientists requesting more details on increasingly complex nanostructures, as well as the ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at a high pace over the last few decades. As the quality of any results can only be as good as the data that goes into these methodologies, the improvements in data collection and all imaginable data correction steps are reviewed here. This work is intended to provide a comprehensive overview of all data corrections, to aid the small-angle scatterer to decide which are relevant for their measurement and how these corrections are performed. Clear mathematical descriptions of the corrections are provided where feasible. Furthermore, as no quality data exists without a decent estimate of its precision, the error estimation and propagation through all these steps is provided alongside the corrections. With these data corrections, the collected small-angle scattering pattern can be made of the highest standard allowing for authoritative nanostructural characterisation through its analysis. A brief background of small-angle scattering, the instrumentation developments over the years, and pitfalls that may be encountered upon data interpretations are provided as well. " "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det "" "" "" "" 104494 web web 2025-07-14 15:02:37 +0900 2025-07-14 15:47:36 +0900 105470 Everything SAXS: Small-angle scattering pattern collection and correction "" "" "" 2015-12-15 21:32:16 +0900 2025-07-14 15:47:35 +0900 online_resource text unknown unknown "" "" https://hdl.handle.net/20.500.11932/1758203 Guest " For obtaining reliable nanostructural details of large amounts of sample --- and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique to use. It promises to obtain bulk-scale, statistically sound information on the morphological details of the nanostructure, and has thus led to many a researcher investing their time in it over the last eight decades of development. Due to pressure both from scientists requesting more details on increasingly complex nanostructures, as well as the ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at a high pace over the last few decades. As the quality of any results can only be as good as the data that goes into these methodologies, the improvements in data collection and all imaginable data correction steps are reviewed here. This work is intended to provide a comprehensive overview of all data corrections, to aid the small-angle scatterer to decide which are relevant for their measurement and how these corrections are performed. Clear mathematical descriptions of the corrections are provided where feasible. Furthermore, as no quality data exists without a decent estimate of its precision, the error estimation and propagation through all these steps is provided alongside the corrections. With these data corrections, the collected small-angle scattering pattern can be made of the highest standard allowing for authoritative nanostructural characterisation through its analysis. A brief background of small-angle scattering, the instrumentation developments over the years, and pitfalls that may be encountered upon data interpretations are provided as well. " "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det "" "" "" "" 104489 web web 2025-07-14 15:02:36 +0900 2025-07-14 15:47:35 +0900 105467 Everything SAXS: Small-angle scattering pattern collection and correction "" "" "" 2015-12-15 21:32:11 +0900 2025-07-14 15:47:35 +0900 online_resource text unknown unknown "" "" https://hdl.handle.net/20.500.11932/1758199 Guest " For obtaining reliable nanostructural details of large amounts of sample --- and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique to use. It promises to obtain bulk-scale, statistically sound information on the morphological details of the nanostructure, and has thus led to many a researcher investing their time in it over the last eight decades of development. Due to pressure both from scientists requesting more details on increasingly complex nanostructures, as well as the ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at a high pace over the last few decades. As the quality of any results can only be as good as the data that goes into these methodologies, the improvements in data collection and all imaginable data correction steps are reviewed here. This work is intended to provide a comprehensive overview of all data corrections, to aid the small-angle scatterer to decide which are relevant for their measurement and how these corrections are performed. Clear mathematical descriptions of the corrections are provided where feasible. Furthermore, as no quality data exists without a decent estimate of its precision, the error estimation and propagation through all these steps is provided alongside the corrections. With these data corrections, the collected small-angle scattering pattern can be made of the highest standard allowing for authoritative nanostructural characterisation through its analysis. A brief background of small-angle scattering, the instrumentation developments over the years, and pitfalls that may be encountered upon data interpretations are provided as well. " "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det "" "" "" "" 104486 web web 2025-07-14 15:02:36 +0900 2025-07-14 15:47:35 +0900 105465 "Everything SAXS: Small-angle scattering pattern collection and correction" "" "" "" 2015-12-15 21:32:09 +0900 2025-07-14 15:47:34 +0900 online_resource text unknown unknown "" "" https://hdl.handle.net/20.500.11932/1758193 Guest " For obtaining reliable nanostructural details of large amounts of sample --- and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique to use. It promises to obtain bulk-scale, statistically sound information on the morphological details of the nanostructure, and has thus led to many a researcher investing their time in it over the last eight decades of development. Due to pressure both from scientists requesting more details on increasingly complex nanostructures, as well as the ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at a high pace over the last few decades. As the quality of any results can only be as good as the data that goes into these methodologies, the improvements in data collection and all imaginable data correction steps are reviewed here. This work is intended to provide a comprehensive overview of all data corrections, to aid the small-angle scatterer to decide which are relevant for their measurement and how these corrections are performed. Clear mathematical descriptions of the corrections are provided where feasible. Furthermore, as no quality data exists without a decent estimate of its precision, the error estimation and propagation through all these steps is provided alongside the corrections. With these data corrections, the collected small-angle scattering pattern can be made of the highest standard allowing for authoritative nanostructural characterisation through its analysis. A brief background of small-angle scattering, the instrumentation developments over the years, and pitfalls that may be encountered upon data interpretations are provided as well. " "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det "" "" "" "" 104484 web web 2025-07-14 15:02:36 +0900 2025-07-14 15:47:34 +0900 104037 Everything SAXS: Small-angle scattering pattern collection and correction "" "" "" 2015-05-28 18:09:45 +0900 2025-07-14 15:47:25 +0900 online_resource text unknown unknown "" "" https://hdl.handle.net/20.500.11932/1758224 Guest " For obtaining reliable nanostructural details of large amounts of sample --- and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique to use. It promises to obtain bulk-scale, statistically sound information on the morphological details of the nanostructure, and has thus led to many a researcher investing their time in it over the last eight decades of development. Due to pressure both from scientists requesting more details on increasingly complex nanostructures, as well as the ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at a high pace over the last few decades. As the quality of any results can only be as good as the data that goes into these methodologies, the improvements in data collection and all imaginable data correction steps are reviewed here. This work is intended to provide a comprehensive overview of all data corrections, to aid the small-angle scatterer to decide which are relevant for their measurement and how these corrections are performed. Clear mathematical descriptions of the corrections are provided where feasible. Furthermore, as no quality data exists without a decent estimate of its precision, the error estimation and propagation through all these steps is provided alongside the corrections. With these data corrections, the collected small-angle scattering pattern can be made of the highest standard allowing for authoritative nanostructural characterisation through its analysis. A brief background of small-angle scattering, the instrumentation developments over the years, and pitfalls that may be encountered upon data interpretations are provided as well. " "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det "" "" "" "" 104422 web web 2025-07-14 15:02:28 +0900 2025-07-14 15:47:25 +0900 103858 Dendritic Amphiphiles: Dendrimers Having an Amphiphile Structure in Each Unit. Ariga Katsuhiko//Urakawa Toshihiro//Michiue Atsuo//Sasaki Yoshihiro//Kikuchi Jun-ichi "" "" 2000-01-01 00:00:00 +0900 2000 2000 2015-05-28 18:08:06 +0900 2025-07-14 15:47:18 +0900 online_resource text unknown unknown "" "" 9147 9150 https://hdl.handle.net/20.500.11932/107911 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 104374 web web 2025-07-14 15:02:21 +0900 2025-07-14 15:47:18 +0900 103811 An artificial signal transduction system. Control of lactate dehydrogenase activity performed by an artificial cell-surface receptor. Ariga Katsuhiko//Kikuchi Jun-ichi//Miyazaki Tatsuo//Ikeda Kouki "" "" 1999-01-01 00:00:00 +0900 1999 1999 2015-05-28 18:07:42 +0900 2025-07-14 15:47:13 +0900 online_resource text unknown unknown "" "" 253 254 https://hdl.handle.net/20.500.11932/107897 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 104329 web web 2025-07-14 15:02:15 +0900 2025-07-14 15:47:13 +0900 103778 Tunable pK of Amino Acid Residues at the Air-Water Interface Gives an L-zyme (Langmuir Enzyme) "" "" "" 2005-01-01 00:00:00 +0900 2005 2005 2015-05-28 18:07:26 +0900 2025-07-14 15:47:09 +0900 online_resource text unknown unknown "" "" 12074 12080 https://hdl.handle.net/20.500.11932/108120 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 104298 web web 2025-07-14 15:02:11 +0900 2025-07-14 15:47:09 +0900 103747 Detection of the phase transition of Langmuir-Blodgett films on a quartz-crystal microbalance in an aqueous phase. Ariga Katsuhiko//Okahata Yoshio//Kimura Kazuhiko "" "" 1989-12-01 00:00:00 +0900 1989-12 1989 2015-05-28 18:07:11 +0900 2025-07-14 15:47:05 +0900 online_resource text unknown unknown "" "" 9190 9194 https://hdl.handle.net/20.500.11932/102621 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 104272 web web 2025-07-14 15:02:08 +0900 2025-07-14 15:47:05 +0900 103736 An atom-probe tomography primer Hono Kazuhiko//Adusumilli P//Blavette D//Cerezo A//Flaitz P.L.//Juraszek J//Kelly T.F "" "" 2009-01-01 00:00:00 +0900 2009 2009 2015-05-28 18:06:59 +0900 2025-07-14 15:47:04 +0900 online_resource text unknown unknown "" "" 717 724 https://hdl.handle.net/20.500.11932/131088 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 104262 web web 2025-07-14 15:02:07 +0900 2025-07-14 15:47:04 +0900