manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 104070 Electron diffraction in the electron microscope "" "" J. W. Edington Edington, Jeffrey William "" MacMillan 1975 1975 2015-06-30 11:03:07 +0900 2025-12-15 09:44:28 +0900 volume text unknown English 9780333182925 "" BA06270941 x, 122 p. ; 30 cm Guest "" "" "" "" "" "" "" "" "" "" 69432 Philips technical library//Monographs in practical electron microscopy in materials science "" "" "" "" 2 "" "" 104070 16387 "" 2024-11-28 21:36:41 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 83485 600500 621.385.833|M|2 namiki N00220402 "" 2015-06-30 00:00:00 +0900 2015-06-30 11:04:25 +0900 2025-12-15 09:44:28 +0900 104069 The operation and calibration of the electron microscope "" "" J.W. Edington Edington, Jeffrey William "" MacMillan 1974 1974 2015-06-30 10:06:50 +0900 2025-12-15 09:44:28 +0900 volume text unknown English 9780333181331 "" BA58681461 [5], 34 p. ; 30 cm Guest "" "" "" "" "" "" "" "" "" "" 69431 Philips technical library//Monographs in practical electron microscopy in materials science "" "" "" "" 1 "" "" 104069 16386 "" 2024-11-28 21:36:40 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 83484 600499 621.385.833|M|1 namiki N00220402 "" 2015-06-30 00:00:00 +0900 2015-06-30 10:16:43 +0900 2025-12-15 09:44:28 +0900 104068 Electron microscopy of interfaces in metals and alloys "" "" C.T. Forwood and L.M. Clarebrough Forwood, C. T.//Clarebrough, L. M. "" Adam Hilger 1991 1991 2015-06-29 17:14:28 +0900 2025-12-15 09:44:23 +0900 volume text unknown English 9780750301169 "" BA13473530 424 p. ; 26 cm Guest "" "" "" "" "" "" "" "" "" "" 69422 Electron microscopy in materials science series "" "" "" "" "" "" "" 104068 16377 "" 2024-11-28 21:36:32 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 83483 600498 621.385.833|H| namiki N00220305 "" 2015-06-29 00:00:00 +0900 2015-06-29 17:15:58 +0900 2025-12-15 09:44:23 +0900 65871 電子顕微鏡研究者のためのFIB・イオンミリング技法Q&A : ナノテクノロジーの推進役 FIB・イオンミリング技法Q&A : 電子顕微鏡研究者のための デンシ ケンビキョウ ケンキュウシャ ノ タメ ノ FIB イオン ミリング ギホウ Q&A : ナノテクノロジー ノ スイシンヤク 平坂雅男, 朝倉健太郎共編 920868 平坂, 雅男//朝倉, 健太郎 "" アグネ承風社 2002-09 2002 2007-10-18 22:35:29 +0900 2025-12-15 09:44:22 +0900 volume text unknown Japanese 9784900508743 "" BA58824376 x, 208p ; 26cm 1 208 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 74514 211003 621.385.833|H|12455 namiki N00220304 2007-10-12 00:00:00 +0900 2010-12-16 02:32:45 +0900 2025-12-15 09:44:22 +0900 66013 Scanning electron microscopy : physics of image formation and microanalysis Ludwig Reimer 68074 Reimer, Ludwig "" Springer 1998 1998 2002-06-21 22:35:47 +0900 2025-12-15 09:44:27 +0900 volume text unknown English 9783540639763 03424111 BA37992011 : hardcover 2 2nd completely revised and updated ed xiv, 527 p. ; 25 cm 1 527 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" 69427 Springer series in optical sciences "" "" "" "" v. 45 "" "" 66013 16382 "" 2024-11-28 21:36:38 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 42154 219240 621.385.833|R|11733 namiki N00220402 2002-07-18 00:00:00 +0900 2010-12-15 23:44:59 +0900 2025-12-15 09:44:27 +0900 42605 Characterisation of radiation damage by transmission electron microscopy M.L. Jenkins, M.A. Kirk 67494 Jenkins, M. L.//Kirk, M. A. "" Institute of Physics Pub. 2001 2002-01-30 02:08:45 +0900 2025-12-15 09:44:25 +0900 volume text unknown English 9780750307482 "" BA53960344 x, 224 p. ; 25 cm 1 224 24.0 Guest "" "" "" "" "" "" "" "" "" "" 69425 Microscopy in materials science series "" "" "" "" "" "" "" 42605 16380 "" 2024-11-28 21:36:37 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 44311 219114 621.385.|J|11641 namiki N00220402 2002-02-07 00:00:00 +0900 2010-12-15 23:55:44 +0900 2025-12-15 09:44:25 +0900 41849 Transmission electron microscopy and diffractometry of materials Brent Fultz, James Howe 65616 Fultz, B.//Howe, James M. "" Springer 2001 2001-07-04 00:58:16 +0900 2025-12-15 09:44:24 +0900 volume text unknown English 9783540678410 "" BA50935635 xix, 748 p. ; 24 cm 1 748 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43447 218843 621.385.833|F|11478 namiki N00220305 2001-06-27 00:00:00 +0900 2010-12-15 23:51:04 +0900 2025-12-15 09:44:23 +0900 4792 Introduction to scanning tunneling microscopy Oxford Series in Optical and Imaging Sciences 4 (Introduction to Scanning Tunneling Microscopy) C. Julian Chen 64593 Chen, C. Julian "" Oxford University Press 1993 1993 2000-12-26 03:48:23 +0900 2025-12-15 09:44:22 +0900 volume text unknown English "" "" BA20444419 xxii, [32], 412 p. ; 24 cm 1 412 23.0 Guest "" "" "" "" "" "" "" "" "" "" 65223 Oxford series in optical and imaging sciences "" "" "" "" 4 "" "" 4792 12459 "" 2024-11-28 20:54:18 +0900 2025-11-13 10:48:20 +0900 "" "" "" "" "" 621.385.833 5193 527878 621.385.||05106 namiki N00220305 1993-07-27 00:00:00 +0900 2010-12-15 20:38:41 +0900 2025-12-15 09:44:22 +0900 4563 Springer Series in Optical Sciences Volume 45 (Scanning Electron Microscopy) Springer Series in Optical Sciences Volume 45 (Scanning Electron Microscopy) 64872 Reimer.L.' "" Springer 1998-01-01 00:00:00 +0900 1998-01-01 1998 2000-12-26 03:42:50 +0900 2025-12-15 09:44:22 +0900 volume text unknown English "" "" 527p; 24cm 1 527 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 4901 527891 621.385.||05395 namiki N00220304 1998-11-13 00:00:00 +0900 2010-12-15 20:37:06 +0900 2025-12-15 09:44:22 +0900 4421 Principles and basic properties Advanced Light Microscopy.Vol.1 (Vol.1:-Principles and Basic Properties.) Maksymilian Pluta 64283 Pluta, Maksymilian "" Elsevier//Distribution for the USA and Canada, Elsevier Science Publishing Co 1988 1988 2000-12-26 03:40:28 +0900 2025-12-15 09:44:27 +0900 volume text unknown English 9780444989390 "" BA04379451 xix, 464 p. ; 25 cm 1 464 24.0 Guest "" "" "" "" "" "" "" "" "" "" 65222 Advanced light microscopy "" "" "" Maksymilian Pluta v. 1 "" "" 4421 12458 "" 2024-11-28 20:54:18 +0900 2025-11-13 10:48:20 +0900 "" "" "" "" "" 621.385.833 4769 527882 621.385.||04794 namiki N00220402 1989-09-26 00:00:00 +0900 2010-12-15 20:36:23 +0900 2025-12-15 09:44:27 +0900