manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 40942 Elektronenmikroskopische Untersuchungs- und Präparationsmethoden von Ludwig Reimer 22577 Reimer, Ludwig "" Springer-Verlag 1959 1901-01-01 09:00:00 +0900 2025-12-15 09:44:25 +0900 volume text unknown German "" "" BA22833783 viii, 300 p. ; 24 cm 1 300 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 42364 201994 621.385.|R|1518 namiki N00220402 1960-05-12 00:00:00 +0900 2010-12-15 23:45:58 +0900 2025-12-15 09:44:25 +0900 41250 High-resolution transmission electron microscopy and associated techniques editors, Peter R. Buseck, John M. Cowley, Leroy Eyring 34026 Buseck, Peter//Cowley, J. M. (John Maxwell)//Eyring, LeRoy "" Oxford University Press 1992 1901-01-01 09:00:00 +0900 2025-12-15 09:44:23 +0900 volume text unknown English 9780195072624 "" BA13872682 : pbk xix, 645 p. ; 24 cm 1 645 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 42706 217813 621.385.833|B|10644 namiki N00220305 1998-07-02 00:00:00 +0900 2010-12-15 23:47:34 +0900 2025-12-15 09:44:23 +0900 42288 ナノ世界への道 ナノ セカイ エノ ミチ 第8回電顕サマースクール実行委員会編 33861 電顕サマースクール//日本電子顕微鏡学会電顕サマースクール実行委員会 第8回 電顕サマースクール実行委員会 学際企画 1997-08 1997 1901-01-01 09:00:00 +0900 2025-12-15 09:44:25 +0900 volume text unknown Japanese 9784906514267 "" BA32392833 240p ; 27cm 1 240 27.0 Guest "" "" "" "" "" "" "" "" "" "" 69415 電顕サマースクール "" デンケン サマー スクール "" "" 第8回 . 電子顕微鏡 : 基礎技術と応用 ; 1997 "" "" 42288 16370 "" 2024-11-28 21:36:29 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 43980 217647 621.385.833|D|10518 namiki N00220305 1998-03-02 00:00:00 +0900 2010-12-15 23:53:43 +0900 2025-12-15 09:44:25 +0900 42080 Scanning electron microscopy/1976 SEM 25830 Johari, Om//IIT Research Institute//Becker, Robert P. edited by Om Johari IIT Research Institute 1976 1976 1901-01-01 09:00:00 +0900 2025-12-15 09:44:27 +0900 volume text unknown English 9780915802098 05865581 BA72401893 1 Vol. 1 1 v. ; 29 cm 1 782 29.0 Guest "" "" "" "" "" "" "" "" "" "" 22296 Scanning electron microscopy "" "" "" "" "" "" "" 42080 977 "" 2012-02-02 10:20:33 +0900 2025-07-11 15:05:59 +0900 "" "" "" "" "" 621.385.833 43684 205652 621.385.|Ｊ|5851 namiki N00220402 1977-02-10 00:00:00 +0900 2010-12-15 23:52:10 +0900 2025-12-15 09:44:27 +0900 42081 Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois SEM edited by Om Johari ; sponsored by IIT research Institute 25832 Scanning Electron Microscope Symposium//Johari, Om//IIT Research Institute edited by Om Johari IIT Research Institute 1977 1901-01-01 09:00:00 +0900 2025-12-15 09:44:28 +0900 volume text unknown English 9780915802111 "" BA22283161 1 Vol. 1 xvi, 783 p. ; 29 cm 1 784 28.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43685 205654 621.385.|J|6184 namiki N00220402 1978-05-29 00:00:00 +0900 2010-12-15 23:52:11 +0900 2025-12-15 09:44:28 +0900 42083 Scanning electron microscopy 1968 : proceedings of the Symposium on the Scanning Electron Microscope -- the instrument and its applications, held at IIT Research Institute, Chicago, Illnois, USA, April 30-May 1, 1968 25829 Scanning Electron Microscope Symposium//IIT Research Institute edited by Om Johari IIT Research Institute 1968 1901-01-01 09:00:00 +0900 2025-12-15 09:44:27 +0900 volume text unknown English "" "" BA10178738 viii, 185 p. ; 29 cm 1 185 28.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43687 205651 621.385.|J|3865 namiki N00220402 1970-05-25 00:00:00 +0900 2010-12-15 23:52:11 +0900 2025-12-15 09:44:27 +0900 42702 Principles and practice of electron microscope operation Alan W. Agar, Ronald H. Alderson, and Dawn Chescoe 25826 Agar, Alan W.//Alderson, Ronald H.//Chescoe, Dawn "" North-Holland//Sole distributors for the U.S.A. and Canada, Elsevier 1974 1901-01-01 09:00:00 +0900 2025-12-15 09:44:24 +0900 volume text unknown English 9780720442540 "" BA01632987 : ne xiv, 345 p. ; 23 cm 1 345 23.0 Guest "" "" "" "" "" "" "" "" "" "" 69416 Practical methods in electron microscopy "" "" "" edited by Audrey M. Glauert v. 2 "" "" 42702 16371 "" 2024-11-28 21:36:29 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 44449 205648 621.385.833|G|6497 namiki N00220305 1979-09-05 00:00:00 +0900 2010-12-15 23:56:33 +0900 2025-12-15 09:44:24 +0900 42053 Procedures in scanning probe microscopies editors, Richard J. Colton ... [et al.] 34087 Colton, R. J. "" Wiley 1998 1901-01-01 09:00:00 +0900 2025-12-15 09:44:23 +0900 volume text unknown English 9780471959120 "" BA35724791 xxxii , 639 p. ; 29 cm 1 639 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43649 217874 621.385.833|C|10675 namiki N00220305 1998-09-24 00:00:00 +0900 2010-12-15 23:52:01 +0900 2025-12-15 09:44:23 +0900 77060 Physical aspects of electron microscopy and microbeam analysis edited by Benjamin M. Siegel and D. R. Beaman 25842 Siegel, Benjamin M.//Electron Microscopy Society of America//Beaman, Donald Robert//Microbeam Analysis Society edited by Benjamin M. Siegel, Donald R. Beaman Wiley 1975 1901-01-01 09:00:00 +0900 2025-12-15 09:44:29 +0900 volume text unknown English 9780471790204 "" BA07555186 xiii, 474 p. ; 26 cm 1 474 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43579 205664 621.385.833|S|5820 namiki N00220403 1976-12-10 00:00:00 +0900 2010-12-15 23:51:41 +0900 2025-12-15 09:44:29 +0900 75851 Specimen preparation in materials science . Electron diffraction and optical diffraction technique P.J. Goodhew . B.E.P. Beeston, Robert W. Horne and Roy Markha 25825 Goodhew, Peter J.//Beeston, B. E. P.//Horne, Robert W.//Markham, Roy "" North-Holland Pub. Co.//American Elsevier Pub. Co. 1972 1901-01-01 09:00:00 +0900 2025-12-15 09:44:24 +0900 volume text unknown English 9780720442519 "" BA10528170 viii, 444 p. ; 23 cm 1 444 23.0 Guest "" "" "" "" "" "" "" "" "" "" 69420 Practical methods in electron microscopy "" "" "" edited by Audrey M. Glauert v. 1, pt. 1-2 "" "" 75851 16375 "" 2024-11-28 21:36:31 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 44448 205647 621.385.833|G|6496 namiki N00220305 1979-09-05 00:00:00 +0900 2010-12-15 23:56:33 +0900 2025-12-15 09:44:24 +0900