manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	serial	manifestation_identifier	creator	contributor	publisher	date_of_publication	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	ncid	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	doi	jpno	ncid	lccn	iss_itemno	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
104096	Practical analytical electron microscopy in materials science	""	""	David B. Williams	false		David B. Williams	""	Verlag Chemie International , Electron Optics Pub. Co., 	1987-01-01 00:00:00 +0900	1987		2015-07-08 11:29:18 +0900	2024-03-04 13:47:31 +0900	volume	text	unknown	English	""	""			""		改訂版		""		vii, 153 p; 29 cm								""	Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						83517	600531		621.385.833|W|	namiki	N00160203	""		2015-07-08 00:00:00 +0900	2015-07-08 11:33:00 +0900	2024-03-04 13:47:31 +0900
4421	Advanced Light Microscopy. Vol.1 (Vol.1:- Principles and Basic Properties.)		Advanced Light Microscopy.Vol.1 (Vol.1:-Principles and Basic Properties.) 			64283	Pluta.M.'	""	Elsevier.	1988-01-01 00:00:00 +0900	1988		2000-12-26 03:40:28 +0900	2022-04-07 17:19:22 +0900	volume	text	unknown	English	""	""									464p; 24cm	1	464		24.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						4769	527882		621.385.||04794	namiki	N00160203			1989-09-26 00:00:00 +0900	2010-12-15 20:36:23 +0900	2022-04-07 17:19:22 +0900
4332	Advanced Light Microscopy. Vol.2 (Vol.2:- Specialized Methods.)		Advanced Light Microscopy.Vol.2 (Vol.2:-Specialized Methods.) 			64284	Pluta.M.'	""	Elsevier.	1989-01-01 00:00:00 +0900	1989		2000-12-26 03:38:43 +0900	2022-04-07 17:19:16 +0900	volume	text	unknown	English	""	""									494p; 24cm	1	494		24.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						4670	527883		621.385.||04795	namiki	N00160203			1989-09-26 00:00:00 +0900	2010-12-15 20:35:51 +0900	2022-04-07 17:19:16 +0900
2570	Advanced Scanning Electron Microscopy and X-Ray Microanalysis		Advanced Scanning Electron Microscopy and X-Ray Microanalysis  			64857	Newbury.D.E. Joy.D.C. Echlin.P.'	""	Plenum Press	1986-01-01 00:00:00 +0900	1986		2000-12-26 03:17:36 +0900	2024-03-04 13:47:31 +0900	volume	text	unknown	English	""	""									454p; 23cm	1	454		23.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						2736	527868		621.385.||05379	namiki	N00160203			1998-09-01 00:00:00 +0900	2010-12-15 20:26:27 +0900	2024-03-04 13:47:31 +0900