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1220	X-ray and electron methods of analysis		  	edited by H. Van Olphen and William Parrish	61598	Eastern Analytical Symposium//Van Olphen, H.//Parrish, William	""	Plenum Press		1968	1968		2000-12-26 03:04:51 +0900	2025-12-15 09:34:02 +0900	volume	text	unknown	English	""	""			BA21446952										x, 164 p. ; 24 cm	1	164		24.0					Guest			""	""	""	""	""	""	""	""	""	""	63318	Progress in analytical chemistry	""	""	""	""	v. 1	""	""	1220	10690	""	2024-11-28 20:36:46 +0900	2025-11-13 10:48:20 +0900	""	""	""	""	""	539.5	1292	528368		539.5||02091	namiki	N00120405			1972-01-21 00:00:00 +0900	2010-12-15 20:18:40 +0900	2025-12-15 09:34:02 +0900
32109	Physical measurement and analysis of thin films		Physical Measurement on Analysis of their Films （Progressin Analytical Chemistry Vol．2）  	edited by E. M. Murt and W. G. Guldner	23044	Eastern Analytical Symposium//Murt, E. M.//Guldner, W. G.	""	Plenum Press		1969			1999-05-19 07:38:01 +0900	2025-12-15 09:35:42 +0900	volume	text	unknown	English	""	""			BA11236002										xi, 194 p. ; 24 cm	1	194		24.0					Guest			""	""	""	""	""	""	""	""	""	""	68033	Progress in analytical chemistry	""	""	""	""	v. 2	""	""	32109	14997	""	2024-11-28 21:19:57 +0900	2025-11-28 13:04:07 +0900	""	""	""	""	""	543	32445	202463		543|Ｍ|	namiki	N00140105			1969-04-01 00:00:00 +0900	2010-12-15 22:56:54 +0900	2025-12-15 09:35:42 +0900