manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	manifestation_identifier	creator	contributor	publisher	date_of_publication	pub_date	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	doi	jpno	ncid	lccn	iss_itemno	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
65882	材料評価のための分析電子顕微鏡法		ザイリョウ ヒョウカ ノ タメ ノ ブンセキ デンシ ケンビキョウホウ	進藤大輔, 及川哲夫共著	35983	進藤, 大輔//及川, 哲夫	""	共立出版		1999-05	1999		2000-06-02 20:07:22 +0900	2025-12-15 09:41:43 +0900	volume	text	unknown	Japanese	9784320085244	""			BA41742572										vi, 182p ; 26cm	1	182		26.0			3890		Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	620.187	39653	218378		620.187|S|11112	namiki	N00200403			2000-06-30 00:00:00 +0900	2010-12-15 23:33:13 +0900	2025-12-15 09:41:43 +0900
32584	Metallurgical Applications of The Scanning Electron Microscope		Metallurgical Applications of The Scanning Electron Microscope		24125	BISRA	""	日本技術調査	1993-01-01 00:00:00 +0900	1993-01-01			1999-05-19 07:47:57 +0900	2025-12-15 09:41:42 +0900	volume	text	unknown	English	""	""													18p; 25cm	1	18		25.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	620.187	33176	203940		620.187|Ｍｅ|	namiki	N00200403			1970-11-25 00:00:00 +0900	2010-12-15 23:01:01 +0900	2025-12-15 09:41:42 +0900
66317	Intermediate voltage microscopy and its application to materials science		  	editor, Krishna Rajan	31868	Rajan, Krishna	""	Electron Optics Pub. Co.		1987			1901-01-01 09:00:00 +0900	2025-12-15 09:41:41 +0900	volume	text	unknown	English	""	""			BA06969795										143 p. ; 28 cm	1	143		28.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	620.187	44154	215623		620.187|R|T-1304	namiki	N00200403			1991-03-20 00:00:00 +0900	2010-12-15 23:54:47 +0900	2025-12-15 09:41:41 +0900