manifestation_id original_title title_alternative title_transcription statement_of_responsibility serial manifestation_identifier creator contributor publisher date_of_publication year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn ncid volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc doi jpno ncid lccn iss_itemno item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 117024 Transmission electron microscopy 4 : Spectrometry "" "" "" false David B. Williams and C. Barry Carter "" Plenum Press 1996-01-01 00:00:00 +0900 1996 "" 2018-12-25 10:46:05 +0900 2023-02-24 16:37:20 +0900 volume text unknown English 9780387765013//9780306453243 "" "" "" "" 729;28cm 553 729 "" Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 83492 600507 621.385.833|W|6 sengen S00110405 "" 2015-06-30 00:00:00 +0900 2015-06-30 16:10:43 +0900 2018-12-25 11:04:54 +0900 117024 Transmission electron microscopy 4 : Spectrometry "" "" "" false David B. Williams and C. Barry Carter "" Plenum Press 1996-01-01 00:00:00 +0900 1996 "" 2018-12-25 10:46:05 +0900 2023-02-24 16:37:20 +0900 volume text unknown English 9780387765013//9780306453243 "" "" "" "" 729;28cm 553 729 "" Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 85501 601917 621.385.833|W| namiki N00030306 "" 2020-01-23 13:24:13 +0900 2023-02-24 16:37:20 +0900 117022 Transmission electron microscopy 3 : Imaging "" "" "" false David B. Williams and C. Barry Carter "" Plenum Press 1996-01-01 00:00:00 +0900 1996 "" 2018-12-25 10:41:48 +0900 2023-02-24 16:37:20 +0900 volume text unknown English 9780387765006//9780306453243 "" "" "" "" 729;28cm 349 549 "" Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 84766 600506 621.385.833|W|3 sengen S00110405 "" 2015-06-30 00:00:00 +0900 2018-12-25 15:25:36 +0900 2019-01-15 11:58:18 +0900 117022 Transmission electron microscopy 3 : Imaging "" "" "" false David B. Williams and C. Barry Carter "" Plenum Press 1996-01-01 00:00:00 +0900 1996 "" 2018-12-25 10:41:48 +0900 2023-02-24 16:37:20 +0900 volume text unknown English 9780387765006//9780306453243 "" "" "" "" 729;28cm 349 549 "" Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 85500 601916 621.385.833|W| namiki N00030306 "" 2020-01-23 13:22:33 +0900 2023-02-24 16:37:20 +0900 117020 Transmission electron microscopy 2 : Diffraction "" "" "" false David B. Williams and C. Barry Carter "" Plenum Press 1996-01-01 00:00:00 +0900 1996 "" 2018-12-25 10:32:35 +0900 2022-04-07 18:26:14 +0900 volume text unknown English 9780387765013//9780306453243 "" "" "" "" 729;28cm 177 345 "" Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 83490 600505 621.385.833|W|2 sengen S00110405 "" 2015-06-30 00:00:00 +0900 2015-06-30 16:07:15 +0900 2019-01-15 11:58:21 +0900 117020 Transmission electron microscopy 2 : Diffraction "" "" "" false David B. Williams and C. Barry Carter "" Plenum Press 1996-01-01 00:00:00 +0900 1996 "" 2018-12-25 10:32:35 +0900 2022-04-07 18:26:14 +0900 volume text unknown English 9780387765013//9780306453243 "" "" "" "" 729;28cm 177 345 "" Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 85499 601915 621.385.833|W| namiki N00160203 "" 2020-01-23 13:20:48 +0900 2022-04-07 18:26:14 +0900 117017 Transmission electron microscopy 1 : Basics "" "" "" false David B. Williams and C. Barry Carter "" Plenum Press 1996-01-01 00:00:00 +0900 1996 "" 2018-12-25 10:27:49 +0900 2022-04-07 18:26:14 +0900 volume text unknown English 9780306453243 "" "" "" "" 729;28cm 1 729 "" Guest "" "" "" "" "" "" "" "" "" "" 26597 Transmission electron microscopy "" "" "" "" "" false "" 117017 6086 "" 2018-12-25 10:27:49 +0900 2023-11-24 14:57:25 +0900 "" "" "" "" "" 621.385.833 83489 600504 621.385.833|W|1 sengen S00110405 "" 2015-06-30 00:00:00 +0900 2015-06-30 16:02:13 +0900 2020-10-16 13:45:43 +0900 117017 Transmission electron microscopy 1 : Basics "" "" "" false David B. Williams and C. Barry Carter "" Plenum Press 1996-01-01 00:00:00 +0900 1996 "" 2018-12-25 10:27:49 +0900 2022-04-07 18:26:14 +0900 volume text unknown English 9780306453243 "" "" "" "" 729;28cm 1 729 "" Guest "" "" "" "" "" "" "" "" "" "" 26597 Transmission electron microscopy "" "" "" "" "" false "" 117017 6086 "" 2018-12-25 10:27:49 +0900 2023-11-24 14:57:25 +0900 "" "" "" "" "" 621.385.833 85498 601914 621.385.833|W| namiki N00160203 "" 2017-12-11 00:00:00 +0900 2020-01-23 12:10:04 +0900 2022-04-07 18:26:14 +0900 104075 第5回電子顕微鏡大学講義テキスト "" ダイ　ゴカイ　デンシケンビキョウ　ダイガク　コウギ　テキスト 日本電子顕微鏡学会 false 日本電子顕微鏡学会 "" 日本電子顕微鏡学会 1995-01-01 00:00:00 +0900 1995 2015-07-01 15:59:03 +0900 2015-07-01 16:51:41 +0900 volume text unknown Japanese "" 09191321 "" "" "" 冊 ; 26cm "" Guest "" "" "" "" "" "" "" "" "" "" 25758 電子顕微鏡大学講義テキスト "" "" "" "" 5回(1995年4月26/27日) false "" 104075 5271 "" 2015-07-01 15:59:04 +0900 2023-10-24 11:38:23 +0900 "" "" "" "" "" 621.385.833 83494 600509 621.385.833|N| sengen S00110404 "" 2015-07-01 00:00:00 +0900 2015-07-01 16:00:37 +0900 2015-07-01 16:51:41 +0900 104068 Electron microscopy of interfaces in metals and alloys "" "" C.T. Forwood and L.M. Clarebrough false C.T. Forwood and L.M. Clarebrough "" IOP Publishing LTD 1991-01-01 00:00:00 +0900 1991 2015-06-29 17:14:28 +0900 2020-10-16 11:51:00 +0900 volume text unknown English "" "" "" "" "" 424 p; 26 cm "" Guest "" "" "" "" "" "" "" "" "" "" 25751 Electron microscopy in materials science series "" "" "" Adam Hilger "" false "" 104068 5264 "" 2015-06-29 17:14:29 +0900 2023-10-24 11:38:23 +0900 "" "" "" "" "" 621.385.833 83483 600498 621.385.833|H| sengen S00110403 "" 2015-06-29 00:00:00 +0900 2015-06-29 17:15:58 +0900 2020-10-16 11:51:00 +0900 66013 Scanning Electron Microscopy : Physics of Image Formation and Microanalysis -2nd ed.- Vol.45 68074 Ludwig Reimer "" Springer 1998-01-01 00:00:00 +0900 1998 2002-06-21 22:35:47 +0900 2023-10-23 15:01:01 +0900 volume text unknown English 9783540639763 03424111 45 Vol.45 2 2nd Completely Revised and Updated Edition 1 527 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 42154 219240 621.385.833|R|11733 sengen S00110404 2002-07-18 00:00:00 +0900 2010-12-15 23:44:59 +0900 2023-10-23 15:01:01 +0900 65863 電子顕微鏡Q&A : 先端材料解析のための手引き デンシ ケンビキョウ Q&A:センタン ザイリョウ カイセキ ノ タメ ノ テビキ 34442 堀内 繁雄, 弘津 禎彦, 朝倉 健太郎 共編 "" アグネ承風社 1996-01-01 00:00:00 +0900 1996 1999-08-12 23:29:24 +0900 2024-03-04 14:00:58 +0900 volume text unknown Japanese 9784900508729 "" 301p; 26cm 1 301 26.0 5985 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 44164 218083 621.385.833|H|10834 sengen S00110403 1999-08-30 00:00:00 +0900 2010-12-15 23:54:51 +0900 2024-03-04 14:00:58 +0900 36251 先端材料評価の電子顕微鏡技法 Sentanzairyo hyouka No Densikenbikyo giho 30630 日本電子顕微鏡学会関東支部編 "" 朝倉書店 1991-01-01 00:00:00 +0900 1999-05-19 08:39:52 +0900 2017-01-16 16:31:54 +0900 volume text unknown Japanese 9784254200539 "" 382p; 27cm 1 382 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 37025 212569 621.385.|Ｄｅ|9243 sengen S00110403 1992-09-24 00:00:00 +0900 2010-12-15 23:19:25 +0900 2016-12-15 10:27:39 +0900 33718 Electron Microscope Fracture Examination to Characterize & Identify Modes of Fracture Electron Microscope Fracture Examination to Characterize & Identify Modes of Fracture 25818 C. D. Beachem "" U. S. Naval Research Laboratory 1993-01-01 00:00:00 +0900 1999-05-19 08:00:11 +0900 2011-03-28 06:19:32 +0900 volume text unknown English "" "" 1 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 34100 205640 621.385.|Ｅｌ|８３３ sengen S00110403 1966-06-06 00:00:00 +0900 2010-12-15 23:05:32 +0900 2010-12-15 23:05:32 +0900