manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 123750 Numerical Analysis and Optimization : An Introduction to Mathematical Modelling and Numerical Simulation "" "" Allaire, Grégoire. "" "" Oxford University Press USA 2007-01-01 00:00:00 +0900 2007 2007 2019-04-26 17:56:19 +0900 2025-07-14 15:49:37 +0900 online_resource text unknown unknown 9780191525520 "" http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=201085 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 105441 web web 2025-07-14 15:04:35 +0900 2025-07-14 15:49:37 +0900 123693 Engineering Materials Volume 2 : An Introduction to Microstructures, Processing and Design "" "" Ashby, M. F.-Jones, David R. H.-Elsevier Science Publishers. "" "" Elsevier Ltd. 1999-01-01 00:00:00 +0900 1999 1999 2019-04-26 17:55:41 +0900 2025-07-14 15:49:31 +0900 online_resource text unknown unknown 9780080545653 "" http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=240202 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 105398 web web 2025-07-14 15:04:29 +0900 2025-07-14 15:49:31 +0900 123668 Basic Engineering Plasticity : An Introduction with Engineering and Manufacturing Applications "" "" Rees, D. W. A. "" "" Elsevier Ltd. 2006-01-01 00:00:00 +0900 2006 2006 2019-04-26 17:55:24 +0900 2025-07-14 15:49:29 +0900 online_resource text unknown unknown 9780080470900 "" http://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=187256 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 105378 web web 2025-07-14 15:04:27 +0900 2025-07-14 15:49:29 +0900 116557 The value and opportunities for sharing research data - an AU perspective "" "" "" 2018-06-18 00:00:00 +0900 2018-06-18 2018 2018-06-28 20:02:36 +0900 2023-07-31 14:42:31 +0900 online_resource text unknown English "" "" https://hdl.handle.net/20.500.11932/1884236 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 100041 web web 2023-07-31 14:42:31 +0900 2023-07-31 14:42:31 +0900 105475 Everything SAXS: Small-angle scattering pattern collection and correction "" "" "" 2015-12-15 21:32:23 +0900 2025-07-14 15:47:36 +0900 online_resource text unknown unknown "" "" https://hdl.handle.net/20.500.11932/1758219 Guest " For obtaining reliable nanostructural details of large amounts of sample --- and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique to use. It promises to obtain bulk-scale, statistically sound information on the morphological details of the nanostructure, and has thus led to many a researcher investing their time in it over the last eight decades of development. Due to pressure both from scientists requesting more details on increasingly complex nanostructures, as well as the ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at a high pace over the last few decades. As the quality of any results can only be as good as the data that goes into these methodologies, the improvements in data collection and all imaginable data correction steps are reviewed here. This work is intended to provide a comprehensive overview of all data corrections, to aid the small-angle scatterer to decide which are relevant for their measurement and how these corrections are performed. Clear mathematical descriptions of the corrections are provided where feasible. Furthermore, as no quality data exists without a decent estimate of its precision, the error estimation and propagation through all these steps is provided alongside the corrections. With these data corrections, the collected small-angle scattering pattern can be made of the highest standard allowing for authoritative nanostructural characterisation through its analysis. A brief background of small-angle scattering, the instrumentation developments over the years, and pitfalls that may be encountered upon data interpretations are provided as well. " "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det "" "" "" "" 104494 web web 2025-07-14 15:02:37 +0900 2025-07-14 15:47:36 +0900 105470 Everything SAXS: Small-angle scattering pattern collection and correction "" "" "" 2015-12-15 21:32:16 +0900 2025-07-14 15:47:35 +0900 online_resource text unknown unknown "" "" https://hdl.handle.net/20.500.11932/1758203 Guest " For obtaining reliable nanostructural details of large amounts of sample --- and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique to use. It promises to obtain bulk-scale, statistically sound information on the morphological details of the nanostructure, and has thus led to many a researcher investing their time in it over the last eight decades of development. Due to pressure both from scientists requesting more details on increasingly complex nanostructures, as well as the ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at a high pace over the last few decades. As the quality of any results can only be as good as the data that goes into these methodologies, the improvements in data collection and all imaginable data correction steps are reviewed here. This work is intended to provide a comprehensive overview of all data corrections, to aid the small-angle scatterer to decide which are relevant for their measurement and how these corrections are performed. Clear mathematical descriptions of the corrections are provided where feasible. Furthermore, as no quality data exists without a decent estimate of its precision, the error estimation and propagation through all these steps is provided alongside the corrections. With these data corrections, the collected small-angle scattering pattern can be made of the highest standard allowing for authoritative nanostructural characterisation through its analysis. A brief background of small-angle scattering, the instrumentation developments over the years, and pitfalls that may be encountered upon data interpretations are provided as well. " "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det "" "" "" "" 104489 web web 2025-07-14 15:02:36 +0900 2025-07-14 15:47:35 +0900 105467 Everything SAXS: Small-angle scattering pattern collection and correction "" "" "" 2015-12-15 21:32:11 +0900 2025-07-14 15:47:35 +0900 online_resource text unknown unknown "" "" https://hdl.handle.net/20.500.11932/1758199 Guest " For obtaining reliable nanostructural details of large amounts of sample --- and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique to use. It promises to obtain bulk-scale, statistically sound information on the morphological details of the nanostructure, and has thus led to many a researcher investing their time in it over the last eight decades of development. Due to pressure both from scientists requesting more details on increasingly complex nanostructures, as well as the ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at a high pace over the last few decades. As the quality of any results can only be as good as the data that goes into these methodologies, the improvements in data collection and all imaginable data correction steps are reviewed here. This work is intended to provide a comprehensive overview of all data corrections, to aid the small-angle scatterer to decide which are relevant for their measurement and how these corrections are performed. Clear mathematical descriptions of the corrections are provided where feasible. Furthermore, as no quality data exists without a decent estimate of its precision, the error estimation and propagation through all these steps is provided alongside the corrections. With these data corrections, the collected small-angle scattering pattern can be made of the highest standard allowing for authoritative nanostructural characterisation through its analysis. A brief background of small-angle scattering, the instrumentation developments over the years, and pitfalls that may be encountered upon data interpretations are provided as well. " "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det "" "" "" "" 104486 web web 2025-07-14 15:02:36 +0900 2025-07-14 15:47:35 +0900 105465 "Everything SAXS: Small-angle scattering pattern collection and correction" "" "" "" 2015-12-15 21:32:09 +0900 2025-07-14 15:47:34 +0900 online_resource text unknown unknown "" "" https://hdl.handle.net/20.500.11932/1758193 Guest " For obtaining reliable nanostructural details of large amounts of sample --- and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique to use. It promises to obtain bulk-scale, statistically sound information on the morphological details of the nanostructure, and has thus led to many a researcher investing their time in it over the last eight decades of development. Due to pressure both from scientists requesting more details on increasingly complex nanostructures, as well as the ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at a high pace over the last few decades. As the quality of any results can only be as good as the data that goes into these methodologies, the improvements in data collection and all imaginable data correction steps are reviewed here. This work is intended to provide a comprehensive overview of all data corrections, to aid the small-angle scatterer to decide which are relevant for their measurement and how these corrections are performed. Clear mathematical descriptions of the corrections are provided where feasible. Furthermore, as no quality data exists without a decent estimate of its precision, the error estimation and propagation through all these steps is provided alongside the corrections. With these data corrections, the collected small-angle scattering pattern can be made of the highest standard allowing for authoritative nanostructural characterisation through its analysis. A brief background of small-angle scattering, the instrumentation developments over the years, and pitfalls that may be encountered upon data interpretations are provided as well. " "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det "" "" "" "" 104484 web web 2025-07-14 15:02:36 +0900 2025-07-14 15:47:34 +0900 105416 "Heat-induced breakage of an optical circuit at a TeO2 glass bridge linking silica glass fibers" TODOROKI, Shin-ichi "" "" 2006-08-01 00:00:00 +0900 2006-08-01 2006 2015-12-15 21:30:36 +0900 2025-07-14 15:47:29 +0900 online_resource text unknown English "" "" 709 712 https://hdl.handle.net/20.500.11932/28314 Guest "The irreversible transformation of a tellurum oxide glass layer inserted between two ends of two silica glass optical fibers was monitored via the intensity of a light passed through the circuit. This structure is used for a heat-induced optical fuse after the soft glass layer has been coated with a light absorber. Heat-induced breakage occurred when the glass crystallized or flowed in the presence of a shearing stress. Without the stress, the optical link was maintained through the glass melt but suddenly broke due to the crystallization. On the other hand, the stress deformed the glass bridge and broke the optical link less than 0.4 sec. Thus, the shearing stress at the splicing point helps the device respond immediately and reliably." "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" optical fiber//telluria glass//plastic flow//optical fuse "" "" "" "" 104446 web web 2025-07-14 15:02:31 +0900 2025-07-14 15:47:29 +0900 105410 An Application of the NTCIR-WEB Raw-data Archive Dataset for User Experiments "" "" "" 2007-05-15 00:00:00 +0900 2007-05-15 2007 2015-12-15 21:30:30 +0900 2025-07-14 15:47:29 +0900 online_resource text unknown English "" "" https://hdl.handle.net/20.500.11932/28303 Guest "This paper presents a simple approach to utilize past test collections as a material for user experiments. We have built a Web-based user interface for NTCIR-5 WEB run results, and conducted a user experiment with 29 subjects to investigate whether performance evaluation metrics of information retrieval systems used in test collections such as TREC and NTCIR comparable to user performance. In this experiment, we selected three types of systems from among systems that participated in NTCIR-5 WEB, and then selected three topics with roughly the same values from among several search topics. The results of the experiment showed no significant differences among these systems and topics in the time for search. While, in general, the user experiment itself have been successfully conducted and shown similar trends with prior study, the approach seems to have some limitations mainly on interactivity and cached page display." "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Evaluation//User experiments//User interface//Rawdata archive//Web information retrieval//Evaluation//User experiments//User interface//Rawdata archive//Web information retrieval//Evaluation//User experiments//User interface//Rawdata archive//Web information retrieval "" "" "" "" 104443 web web 2025-07-14 15:02:31 +0900 2025-07-14 15:47:29 +0900