manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	serial	manifestation_identifier	creator	contributor	publisher	date_of_publication	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	ncid	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	doi	jpno	ncid	lccn	iss_itemno	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
42081	Scanning Electron Microscopy/ 1977/ 1 : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and Workshop on Materials and Component Characterization / Quality Control with the SEM/STEM SEM Applications to Semiconductors Analytical Electron Microscopy Biological Specimen Preparation for Sem March 28-April 1, 1977		  			25832	edited by Om Johari	edited by Om Johari	IIT Research Institute				1901-01-01 09:00:00 +0900	2010-12-27 05:19:18 +0900	volume	text	unknown	English	9780915802111	""									784p; 28cm	1	784		28.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						43685	205654		621.385.|J|6184	sengen	S00110404			1978-05-29 00:00:00 +0900	2010-12-15 23:52:11 +0900	2010-12-15 23:52:11 +0900
42083	Scanning Electron Microscopy/ 1968 : Proceedings of the Symposium on The Scanning Electron Microscope -- The Instrument and Its Applications April 30-May1, 1968 Chicago, Illinois		  			25829	edited by Om Johari	edited by Om Johari	IIT Research Institute	1968-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2011-04-03 02:47:20 +0900	volume	text	unknown	English	""	""									185p; 28cm	1	185		28.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						43687	205651		621.385.|J|3865	sengen	S00110404			1970-05-25 00:00:00 +0900	2010-12-15 23:52:11 +0900	2010-12-15 23:52:11 +0900
41250	High-Resolution Transmission Electron Microscopy and Associated Techniques		  			34026	editors, Peter R. Buseck, John M. Cowley, LeRoy Eyring	""	Oxford University Press	1992-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2011-04-03 02:41:40 +0900	volume	text	unknown	English	9780195072624	""									645p; 24cm	1	645		24.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						42706	217813		621.385.833|B|10644	sengen	S00110403			1998-07-02 00:00:00 +0900	2010-12-15 23:47:34 +0900	2010-12-15 23:47:34 +0900
41111	ミクロの世界・物質編：目で観る物性論		ミクロ ノ セカイ・ブッシツ ヘン:メ デ ミル ブッセイ ロン  			33863	日本電子顕微鏡学会	日本電子顕微鏡学会	学際企画	1997-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2022-04-07 17:42:41 +0900	volume	text	unknown	Japanese	9784906514274	""									408p; 27cm	1	408		27.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						42548	217649		621.385.833|N|10520	sengen	S00110404			1998-03-02 00:00:00 +0900	2010-12-15 23:46:50 +0900	2022-04-07 17:42:41 +0900
41486	In Situ Experiments with High Voltage Electron Microscopes		  			24999	eitor in chief, Hiroshi Fujita	""	Research Center for Ultra-High Voltage Electron Microscopy, Osaka University	1985-01-01 00:00:00 +0900	1985		1901-01-01 09:00:00 +0900	2012-06-26 17:08:10 +0900	volume	text	unknown	English	9784990006518	""									506p; 27cm	1	506		27.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						43009	204815		621.385.833|F|ｷ 184	sengen	S00110403			1986-09-10 00:00:00 +0900	2010-12-15 23:49:00 +0900	2012-06-26 17:08:10 +0900
77865	Techniques for Electron Microscopy -2nd ed.-		  			32920	edited by Desmond H. Kay ; foreword by V.E. Cosslett	edited by Desmond H. Kay ; foreword by V.E. Cosslett	Blackwell Scientific Publications	1965-01-01 00:00:00 +0900	1965		1901-01-01 09:00:00 +0900	2012-06-25 20:15:57 +0900	volume	text	unknown	English	""	""					Second edition					1	560		0.0	0.0	0.0			Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						43575	216706		621.385.833|Ｋ|2983	sengen	S00110404			1966-05-24 00:00:00 +0900	2010-12-15 23:51:40 +0900	2010-12-15 23:51:40 +0900
69204	Practical Analytical Electron Microscopy in Materials Science		  			31864	Daid B. Williams	""	Philips Electronic Instruments	1984-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2020-02-27 16:00:32 +0900	volume	text	unknown	English	9780961293406	""									153p; 29cm	1	153		29.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						44148	215619		621.385.833|W|	sengen	S00110405	""		1991-03-20 00:00:00 +0900	2010-12-15 23:54:45 +0900	2020-02-27 16:00:32 +0900
65850	Advanced Scanning Electron Microscopy and X-Ray Microanalysis		  			33992	Dale E. Newbury, David C. Joy, Patrick Echlin [et al.]	""	Plenum Press	1986-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2022-04-07 17:43:24 +0900	volume	text	unknown	English	9780306421402	""									454p; 24cm	1	454		24.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						43557	217779		621.385.833|N|10615	sengen	S00110404			1998-05-14 00:00:00 +0900	2010-12-15 23:51:35 +0900	2022-04-07 17:43:24 +0900
65852	Microscopy of Oxidation 2 ; Proceedings of The Second International Conference on The Microscopy of Oxidation held At Selwyn College,The University of Cambridge 29-31 March 1993		  			33960	edite by S.B. Newcomb, M.J. Bennett	""	The Institute of Materials	1993-01-01 00:00:00 +0900	1993		1901-01-01 09:00:00 +0900	2012-06-26 17:07:13 +0900	volume	text	unknown	English	9780901716507	""		552	552						593p; 26cm	1	593		26.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						38608	217746		621.385.833|N|ｷ803	sengen	S00110404			1998-04-01 00:00:00 +0900	2010-12-15 23:27:32 +0900	2012-06-26 17:07:13 +0900
75851	Practical Methods in Electron Microscopy/ Specimen Preparation in Materials Science [Part 1]/ Electron Diffraction and Optical Diffraction Techniques [Part 2]  Vol.1 Part 1.2		  			25825	P.J. Goodhew [Part 1]/ B.E.P. Beeston, Robert W. Horne and Roy Markham[Part 2]	""	North-Holland	1972-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2011-04-03 02:22:33 +0900	volume	text	unknown	English	9780720442519	""			Vol.1						444p; 23cm	1	444		23.0					Guest			""	""	""	""	""	""	""	""	""	""	293	Practical Methods in Electron Microscopy	""	""	""	""	""	""	""	75851	165	""	2011-03-30 23:50:24 +0900	2013-05-24 16:48:32 +0900	""	""	""	""	""	621.385.833						44448	205647		621.385.833|G|6496	sengen	S00110403			1979-09-05 00:00:00 +0900	2010-12-15 23:56:33 +0900	2010-12-15 23:56:33 +0900