manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	serial	manifestation_identifier	creator	contributor	publisher	date_of_publication	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	ncid	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	doi	jpno	ncid	lccn	iss_itemno	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
77060	Physical Aspects of Electron Microscopy and Microbeam Analysis: Jointly sponsored by the Electron Microscopy Society of America and the Microbeam Analysis Society		  			25842	edited by Benjamin M. Siegel, Donald R. Beaman	edited by Benjamin M. Siegel, Donald R. Beaman	John Wiley & Sons	1975-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2016-10-24 08:47:00 +0900	volume	text	unknown	English	9780471790204	""									474p; 27cm	1	474		27.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						43579	205664		621.385.833|S|5820	sengen	S00110405			1976-12-10 00:00:00 +0900	2010-12-15 23:51:41 +0900	2016-10-24 08:47:00 +0900
68768	Transmission Electron Microscopy: A Textbook for Material Science		  			33380	David B. Williams and C. Barry Carter	""	Plenum Press	1996-01-01 00:00:00 +0900	1996		1901-01-01 09:00:00 +0900	2022-05-19 18:17:25 +0900	volume	text	unknown	English	9780306452475	""									729p; 29cm	1	729		29.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						42549	217166		621.385.833|W|10078	sengen	S00110405			1997-02-20 00:00:00 +0900	2010-12-15 23:46:50 +0900	2022-05-19 18:17:25 +0900
72197	Transmission Electron Microscopy : Physics of Image Formation and Microanalysis -3rd ed.-  Vol.36		  			31251	Ludwig Reimer, Guest editor, Peter W. Hawkes	""	Springer-Verlag	1993-01-01 00:00:00 +0900	1993		1901-01-01 09:00:00 +0900	2017-08-22 11:56:07 +0900	volume	text	unknown	English	9783540568490	""		36	Vol.36		Third edition					1	545		0.0	0.0	0.0			Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						42174	213207		621.385.833|R|9489	sengen	S00110404			1994-12-02 00:00:00 +0900	2010-12-15 23:45:05 +0900	2017-08-22 11:56:07 +0900