manifestation_id original_title title_alternative title_transcription statement_of_responsibility serial manifestation_identifier creator contributor publisher date_of_publication year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn ncid volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc doi jpno ncid lccn iss_itemno item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 104069 The operation and calibration of the electron microscope "" "" J.W. Edington false J.W. Edington "" Macmillan 1974-01-01 00:00:00 +0900 1974 2015-06-30 10:06:50 +0900 2016-12-12 21:24:11 +0900 volume text unknown English "" "" "" "" "" [5], 34 p; 30cm "" Guest "" "" "" "" "" "" "" "" "" "" 25752 Monographs in practical electron microscopy in materials science "" "" "" Macmillan 1 false "" 104069 5265 "" 2015-06-30 10:06:50 +0900 2023-10-24 11:38:23 +0900 "" "" "" "" "" 621.385.833 83484 600499 621.385.833|M|1 sengen S00110404 "" 2015-06-30 00:00:00 +0900 2015-06-30 10:16:43 +0900 2016-12-12 21:24:11 +0900 104068 Electron microscopy of interfaces in metals and alloys "" "" C.T. Forwood and L.M. Clarebrough false C.T. Forwood and L.M. Clarebrough "" IOP Publishing LTD 1991-01-01 00:00:00 +0900 1991 2015-06-29 17:14:28 +0900 2020-10-16 11:51:00 +0900 volume text unknown English "" "" "" "" "" 424 p; 26 cm "" Guest "" "" "" "" "" "" "" "" "" "" 25751 Electron microscopy in materials science series "" "" "" Adam Hilger "" false "" 104068 5264 "" 2015-06-29 17:14:29 +0900 2023-10-24 11:38:23 +0900 "" "" "" "" "" 621.385.833 83483 600498 621.385.833|H| sengen S00110403 "" 2015-06-29 00:00:00 +0900 2015-06-29 17:15:58 +0900 2020-10-16 11:51:00 +0900 65871 電子顕微鏡研究者のための FIB・イオンミリング技法Q&A：ナノテクノロジーの推進役 デンシ ケンビキョウ ケンキュウシャ ノ タメ ノ FIB・イオン ミリ ング ギホウ Q&A:ナノ テクノロジー ノ スイシンヤク 920868 平坂 雅夫//朝倉 健太郎 共編 "" アグネ承風社 2002-01-01 00:00:00 +0900 2002 2007-10-18 22:35:29 +0900 2024-03-04 14:00:58 +0900 volume text unknown Japanese 9784900508743 "" 第一版 1 208 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 74514 211003 621.385.833|H|12455 sengen S00110403 2007-10-12 00:00:00 +0900 2010-12-16 02:32:45 +0900 2024-03-04 14:00:58 +0900 66013 Scanning Electron Microscopy : Physics of Image Formation and Microanalysis -2nd ed.- Vol.45 68074 Ludwig Reimer "" Springer 1998-01-01 00:00:00 +0900 1998 2002-06-21 22:35:47 +0900 2023-10-23 15:01:01 +0900 volume text unknown English 9783540639763 03424111 45 Vol.45 2 2nd Completely Revised and Updated Edition 1 527 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 42154 219240 621.385.833|R|11733 sengen S00110404 2002-07-18 00:00:00 +0900 2010-12-15 23:44:59 +0900 2023-10-23 15:01:01 +0900 42605 Characterization of Radiation Damage by Transmission Electron Microscopy 67494 M.L. Jenkins, M.A. Kirk "" Institute of Physics (IOP) 2001-01-01 00:00:00 +0900 2002-01-30 02:08:45 +0900 2024-03-04 14:00:59 +0900 volume text unknown English 9780750307482 "" Science 224p; 24cm 1 224 24.0 Guest "" "" "" "" "" "" "" "" "" "" 1197 Series in Microscopy in Materials Science "" "" "" "" "" "" "" 42605 662 "" 2011-03-30 23:56:45 +0900 2013-04-22 23:56:50 +0900 "" "" "" "" "" 621.385.833 44311 219114 621.385.|J|11641 sengen S00110403 2002-02-07 00:00:00 +0900 2010-12-15 23:55:44 +0900 2024-03-04 14:00:59 +0900 41849 Transmission Electron Microscopy and Diffractometry of Materials 65616 Brent Fultz, James M. Howe "" Springer 2001-07-04 00:58:16 +0900 2018-05-21 16:09:19 +0900 volume text unknown English 9783540678410 "" 1 748 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43447 218843 621.385.833|F|11478 sengen S00110403 2001-06-27 00:00:00 +0900 2010-12-15 23:51:04 +0900 2018-05-21 16:09:19 +0900 4792 Oxford Series in Optical and Imaging Sciences 4 (Introduction to Scanning Tunneling Microscopy) Oxford Series in Optical and Imaging Sciences 4 (Introduction to Scanning Tunneling Microscopy) 64593 Chen.C.J.' "" Oxford University Press 1993-01-01 00:00:00 +0900 1993 2000-12-26 03:48:23 +0900 2022-04-07 17:19:50 +0900 volume text unknown English "" "" 412p; 23cm 1 412 23.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 5193 527878 621.385.||05106 namiki N00160203 1993-07-27 00:00:00 +0900 2010-12-15 20:38:41 +0900 2022-04-07 17:19:50 +0900 4563 Springer Series in Optical Sciences Volume 45 (Scanning Electron Microscopy) Springer Series in Optical Sciences Volume 45 (Scanning Electron Microscopy) 64872 Reimer.L.' "" Springer 1998-01-01 00:00:00 +0900 1998 2000-12-26 03:42:50 +0900 2022-04-07 17:19:31 +0900 volume text unknown English "" "" 527p; 24cm 1 527 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 4901 527891 621.385.||05395 namiki N00160202 1998-11-13 00:00:00 +0900 2010-12-15 20:37:06 +0900 2022-04-07 17:19:31 +0900 4421 Advanced Light Microscopy. Vol.1 (Vol.1:- Principles and Basic Properties.) Advanced Light Microscopy.Vol.1 (Vol.1:-Principles and Basic Properties.) 64283 Pluta.M.' "" Elsevier. 1988-01-01 00:00:00 +0900 1988 2000-12-26 03:40:28 +0900 2022-04-07 17:19:22 +0900 volume text unknown English "" "" 464p; 24cm 1 464 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 4769 527882 621.385.||04794 namiki N00160203 1989-09-26 00:00:00 +0900 2010-12-15 20:36:23 +0900 2022-04-07 17:19:22 +0900 4332 Advanced Light Microscopy. Vol.2 (Vol.2:- Specialized Methods.) Advanced Light Microscopy.Vol.2 (Vol.2:-Specialized Methods.) 64284 Pluta.M.' "" Elsevier. 1989-01-01 00:00:00 +0900 1989 2000-12-26 03:38:43 +0900 2022-04-07 17:19:16 +0900 volume text unknown English "" "" 494p; 24cm 1 494 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 4670 527883 621.385.||04795 namiki N00160203 1989-09-26 00:00:00 +0900 2010-12-15 20:35:51 +0900 2022-04-07 17:19:16 +0900