manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 74773 SEM microcharacterization of semiconductors edited by D.B. Holt, D.C. Joy 32398 Holt, D. B.//Joy, David C. edited by D.B. Holt, D.C. Joy Academic Press 1989 1901-12-31 09:00:00 +0900 2025-12-15 09:40:15 +0900 volume text unknown English 9780123538550 "" BA10022466 xiii, 452 p. ; 24 cm 1 452 24.0 Guest "" "" "" "" "" "" "" "" "" "" 68567 Techniques of physics "" "" "" "" 12 "" "" 74773 15524 "" 2024-11-28 21:25:57 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 548.73 40193 216176 548.73|Ｈ|T-1311 namiki N00180403 1991-03-22 00:00:00 +0900 2010-12-15 23:35:48 +0900 2025-12-15 09:40:15 +0900 39204 X線結晶学の理論と実際 Theorie et Technique de la Radiocristallographie Xセン ケッショウガク ノ リロン ト ジッサイ アンドレ・ギニエ [著] ; 高良和武 [ほか] 共訳 28218 Guinier, André//高良, 和武 "" 理学電機図書出版社 1960-04 1901-12-31 09:00:00 +0900 2025-12-15 09:40:13 +0900 volume text unknown Japanese "" "" BN03635525 18, 640p ; 27cm 1 640 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.73 40313 208299 548.73|G|1721 namiki N00180403 1961-08-22 00:00:00 +0900 2010-12-15 23:36:21 +0900 2025-12-15 09:40:13 +0900 40423 Powder diffraction file Powder diffraction file : data book//PDF compiled by the Joint Committee On Powder Diffraction Standards in cooperation with American Society for Testing and Materials ... [et al.] 32068 Joint Committee on Powder Diffraction Standards//American Society for Testing and Materials "" Joint Committee on Powder Diffraction Standards 1960 1901-12-31 09:00:00 +0900 2025-12-15 09:40:14 +0900 volume text unknown English "" "" BA00328197 1 sets 1-5 Inorganic volume, No. PD1S-5iRB (revised) 1 v. ; 24 cm 1 685 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.73 41739 215826 548.73|J|T-464 namiki N00180403 1981-01-20 00:00:00 +0900 2010-12-15 23:43:02 +0900 2025-12-15 09:40:14 +0900 39026 X-ray diffraction by polycrystalline materials technical editors, H.S. Peiser, H.P. Rooksby, A.J.C. Wilson 29599 Peiser, H. Steffen (Herbert Steffen)//Rooksby, H. P.//Wilson, A. J. C. (Arthur James Cochran) "" The Institute of Physics 1955 1901-12-31 09:00:00 +0900 2025-12-15 09:40:15 +0900 volume text unknown English "" "" BA23038414 725 p. ; 26 cm 1 725 26.0 Guest "" "" "" "" "" "" "" "" "" "" 68580 Physics in industry series "" "" "" "" "" "" "" 39026 15536 "" 2024-11-28 21:26:08 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 548.73 40073 209709 548.73|P|273 namiki N00180404 1957-08-12 00:00:00 +0900 2010-12-15 23:35:14 +0900 2025-12-15 09:40:15 +0900 39000 Powder diffraction file Powder diffraction file : data book//PDF compiled by the JCPDS - International Centre for Diffraction Data in cooperation with the American Society for Testing Materials ... [et al.] 32075 JCPDS-International Centre for Diffraction Data//American Society for Testing and Materials "" Joint Committee on Powder Diffraction Standards 1984 1901-12-31 09:00:00 +0900 2025-12-15 09:40:16 +0900 volume text unknown English "" "" BA00328197 25 sets 25 to 26 Inorganic volume 1 v. ; 24 cm 1 1050 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.73 40048 215833 548.73|Ｊ|T-628 namiki N00180404 1984-10-24 00:00:00 +0900 2010-12-15 23:35:07 +0900 2025-12-15 09:40:16 +0900 37996 Elements of X-Ray diffraction by B.D. Cullity 28973 Cullity, B. D. (Bernard Dennis) "" Addison-Wesley 1956 1956 1901-01-01 09:00:00 +0900 2025-12-15 09:40:14 +0900 volume text unknown English "" "" BA0459807X xiv, 514 p. ; 24 cm 1 514 24.0 Guest "" "" "" "" "" "" "" "" "" "" 68565 Addison-Wesley series in metallurgy and materials "" "" "" "" "" "" "" 37996 15523 "" 2024-11-28 21:25:54 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 548.73 39097 209076 548.73|C|3832 namiki N00180403 1970-04-01 00:00:00 +0900 2010-12-15 23:30:01 +0900 2025-12-15 09:40:14 +0900 42278 Applications of X-ray topographic methods to materials science edited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff 31914 France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science//Weissmann, Sigmund//Balibar, Françoise//Petroff, Jean-François//Centre national de la recherche scientifique//National Science Foundation (U.S.) edited by Sigmund Weissmann, Francoise Balibar, and Jean-Francois Petroff Plenum Press 1984 1901-01-01 09:00:00 +0900 2025-12-15 09:40:16 +0900 volume text unknown English 9780306418389 "" BA00019363 xiii, 536 p. ; 26 cm 1 536 26.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.73 43968 215670 548.73|W|T-985 namiki N00180404 1988-04-01 00:00:00 +0900 2010-12-15 23:53:39 +0900 2025-12-15 09:40:16 +0900 37748 High resolution X-ray diffractometry and topography D. Keith Bowen and Brian K. Tanner 34019 Bowen, D. Keith (David Keith)//Tanner, B. K. (Brian Keith) "" Taylor & Francis 1998 1901-01-01 09:00:00 +0900 2025-12-15 09:40:14 +0900 volume text unknown English "" "" BA39292928 x, 252 p. ; 26 cm 1 252 26.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.73 38660 217806 548.73|Ｂ| namiki N00180403 1998-07-06 00:00:00 +0900 2010-12-15 23:27:47 +0900 2025-12-15 09:40:14 +0900 65883 The interpretation of X-ray diffraction photographs by N.F.M. Henry, H. Lipson, W.A. Wooster 29583 Henry, Norman Fordyce McKerron//Lipson, H. (Henry)//Wooster, W. A. (William Alfred) "" Macmillan; St. Martin's P 1960 1960 1901-01-01 09:00:00 +0900 2025-12-15 09:40:14 +0900 volume text unknown English "" "" BA04657758 2 2nd ed x, 282 p. ; 26 cm 1 282 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.73 44513 209692 548.73|H|2136 namiki N00180403 1963-02-12 00:00:00 +0900 2010-12-15 23:56:56 +0900 2025-12-15 09:40:14 +0900 75842 Ｘ線回折要論 Elements of X-ray diffraction Xセン カイセツ ヨウロン カリティ [著] ; 松村源太郎訳 28425 Cullity, B. D. (Bernard Dennis)//松村, 源太郎 松村源太郎 アグネ 1980-06 1980 1901-01-01 09:00:00 +0900 2026-01-21 10:03:45 +0900 volume text unknown Japanese 9784900508576 "" BN00073382 新版 16, 516p ; 22cm 1 516 0.0 0.0 0.0 5700 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.73 42732 208519 548.73|C|8263 sengen S00990909 1988-03-17 00:00:00 +0900 2010-12-15 23:47:42 +0900 2025-05-12 09:53:10 +0900 75842 Ｘ線回折要論 Elements of X-ray diffraction Xセン カイセツ ヨウロン カリティ [著] ; 松村源太郎訳 28425 Cullity, B. D. (Bernard Dennis)//松村, 源太郎 松村源太郎 アグネ 1980-06 1980 1901-01-01 09:00:00 +0900 2026-01-21 10:03:45 +0900 volume text unknown Japanese 9784900508576 "" BN00073382 新版 16, 516p ; 22cm 1 516 0.0 0.0 0.0 5700 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 548.73 83705 600782 548.73|C| namiki N00180403 "" 2016-02-24 00:00:00 +0900 2016-02-24 17:06:03 +0900 2026-01-21 10:03:45 +0900