manifestation_id original_title title_alternative title_transcription statement_of_responsibility serial manifestation_identifier creator contributor publisher date_of_publication year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn ncid volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc doi jpno ncid lccn iss_itemno item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 38369 Handbook of Microscopy : Applications in Materials Science, Solid-State Physics and Chemistry ; Applications Applications 33795 edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo VCH 1997-01-01 00:00:00 +0900 1999-05-18 22:52:00 +0900 2011-04-03 02:21:51 +0900 volume text unknown English 9783527292936 "" 833p; 25cm 1 833 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 39350 217581 621.385.833|Ａ|10463 sengen S00230305 1998-01-23 00:00:00 +0900 2010-12-15 23:31:28 +0900 2010-12-15 23:31:28 +0900 31504 Handbook of Microscopy : Applications in Materials Science, Solid-State Physics and Chemistry: Methods Ⅱ Methods 2 33794 edited by S. Amelinckx, D.van Dyck, J.van Landuyt, G. Van Tendeloo edited by S. Amelinckx, D.van Dyck, J.van Landuyt, G. Van Tendeloo VCH 1997-01-01 00:00:00 +0900 1999-05-19 04:40:00 +0900 2011-03-31 18:13:03 +0900 volume text unknown English 9783527294732 "" 539p; 25cm 1 539 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 39703 217580 621.385.833|Ａ|10462 sengen S00230305 1998-01-23 00:00:00 +0900 2010-12-15 23:33:29 +0900 2010-12-15 23:33:29 +0900 31505 Handbook of Microscopy : Applications in Materials Science, Solid-State Physics and Chemistry: MethodsⅠ Methods 1 33793 edited by S. Amelinckx, D.van Dyck, J.van Landuyt, G.Van Tendeloo edited by S. Amelinckx, D.van Dyck, J.van Landuyt, G.Van Tendeloo VCH 1997-01-01 00:00:00 +0900 1999-05-19 04:39:00 +0900 2011-03-31 18:13:03 +0900 volume text unknown English 9783527292806 "" 1p; 25cm 1 1 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 39702 217579 621.385.833|Ａ|10461 sengen S00230305 1998-01-23 00:00:00 +0900 2010-12-15 23:33:29 +0900 2010-12-15 23:33:29 +0900 41250 High-Resolution Transmission Electron Microscopy and Associated Techniques 34026 editors, Peter R. Buseck, John M. Cowley, LeRoy Eyring "" Oxford University Press 1992-01-01 00:00:00 +0900 1901-01-01 09:00:00 +0900 2011-04-03 02:41:40 +0900 volume text unknown English 9780195072624 "" 645p; 24cm 1 645 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 42706 217813 621.385.833|B|10644 sengen S00110403 1998-07-02 00:00:00 +0900 2010-12-15 23:47:34 +0900 2010-12-15 23:47:34 +0900 41486 In Situ Experiments with High Voltage Electron Microscopes 24999 eitor in chief, Hiroshi Fujita "" Research Center for Ultra-High Voltage Electron Microscopy, Osaka University 1985-01-01 00:00:00 +0900 1985 1901-01-01 09:00:00 +0900 2012-06-26 17:08:10 +0900 volume text unknown English 9784990006518 "" 506p; 27cm 1 506 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43009 204815 621.385.833|F|ｷ 184 sengen S00110403 1986-09-10 00:00:00 +0900 2010-12-15 23:49:00 +0900 2012-06-26 17:08:10 +0900 42761 Introduction to Scanning Tunneling Microscopy 30562 C. Julian Chen "" Oxford University Press 1993-01-01 00:00:00 +0900 1901-01-01 09:00:00 +0900 2011-04-03 02:52:26 +0900 volume text unknown English 9780195071504 "" 4 4 412p; 24cm 1 412 24.0 19600 Guest "" "" "" "" "" "" "" "" "" "" 1017 Oxford Series in Optical and Imaging Sciences "" "" "" "" "" "" "" 42761 564 "" 2011-03-30 23:55:48 +0900 2013-05-24 16:30:16 +0900 "" "" "" "" "" 621.385.833 44523 210679 621.385.833|C|T-1535 sengen S00110403 1994-03-31 00:00:00 +0900 2010-12-15 23:57:00 +0900 2011-02-23 14:16:18 +0900 65852 Microscopy of Oxidation 2 ; Proceedings of The Second International Conference on The Microscopy of Oxidation held At Selwyn College,The University of Cambridge 29-31 March 1993 33960 edite by S.B. Newcomb, M.J. Bennett "" The Institute of Materials 1993-01-01 00:00:00 +0900 1993 1901-01-01 09:00:00 +0900 2012-06-26 17:07:13 +0900 volume text unknown English 9780901716507 "" 552 552 593p; 26cm 1 593 26.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 38608 217746 621.385.833|N|ｷ803 sengen S00110404 1998-04-01 00:00:00 +0900 2010-12-15 23:27:32 +0900 2012-06-26 17:07:13 +0900 2582 New Direction in Transmission Electron Microscopy and Nano-characterization of Materials New Direction in Transmission Electron Microscopy and Nano-characterization of Materials 64873 Kinoshita.C.' "" Kyushu University 1998-01-01 00:00:00 +0900 1998 2000-12-26 03:17:45 +0900 2022-04-07 17:17:02 +0900 volume text unknown English "" "" 392p; 26cm 1 392 26.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 2751 527905 621.385.||05396 namiki N00160202 1998-11-13 00:00:00 +0900 2010-12-15 20:26:31 +0900 2022-04-07 17:17:02 +0900 4792 Oxford Series in Optical and Imaging Sciences 4 (Introduction to Scanning Tunneling Microscopy) Oxford Series in Optical and Imaging Sciences 4 (Introduction to Scanning Tunneling Microscopy) 64593 Chen.C.J.' "" Oxford University Press 1993-01-01 00:00:00 +0900 1993 2000-12-26 03:48:23 +0900 2022-04-07 17:19:50 +0900 volume text unknown English "" "" 412p; 23cm 1 412 23.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 5193 527878 621.385.||05106 namiki N00160203 1993-07-27 00:00:00 +0900 2010-12-15 20:38:41 +0900 2022-04-07 17:19:50 +0900 77060 Physical Aspects of Electron Microscopy and Microbeam Analysis: Jointly sponsored by the Electron Microscopy Society of America and the Microbeam Analysis Society 25842 edited by Benjamin M. Siegel, Donald R. Beaman edited by Benjamin M. Siegel, Donald R. Beaman John Wiley & Sons 1975-01-01 00:00:00 +0900 1901-01-01 09:00:00 +0900 2016-10-24 08:47:00 +0900 volume text unknown English 9780471790204 "" 474p; 27cm 1 474 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43579 205664 621.385.833|S|5820 sengen S00110405 1976-12-10 00:00:00 +0900 2010-12-15 23:51:41 +0900 2016-10-24 08:47:00 +0900