manifestation_id original_title title_alternative title_transcription statement_of_responsibility serial manifestation_identifier creator contributor publisher date_of_publication year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn ncid volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc doi jpno ncid lccn iss_itemno item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 37164 Developments in Electron Microscopy and Analysis. 25841 edited and introduced by J.A. Venables "" Academic Press 1976-01-01 00:00:00 +0900 1999-05-19 08:00:43 +0900 2016-10-24 08:46:55 +0900 volume text unknown English 9780127169507 "" 537p; 27cm 1 537 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 34142 205663 621.385.833|Ｖ|5861 sengen S00110405 1977-02-18 00:00:00 +0900 2010-12-15 23:05:44 +0900 2016-10-24 08:46:55 +0900 39490 走査電子顕微鏡：基礎と応用 ソウサ デンシ ケンビキョウ:キソ ト オウヨウ 31873 日本電子顕微鏡学会関東支部 日本電子顕微鏡学会関東支部 共立出版 1976-01-01 00:00:00 +0900 1901-12-31 09:00:00 +0900 2020-10-16 11:39:14 +0900 volume text unknown Japanese "" "" 289p; 22cm 1 289 22.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 40627 215628 621.385.833|N|T-66 sengen S00110404 1977-12-26 00:00:00 +0900 2010-12-15 23:37:50 +0900 2020-10-16 11:39:14 +0900 42080 Scanning Electron Microscopy/ 1976/ 1 : Proceedings of the Part 1 9th Annual Scanning Electron Microscope Symposium / Part 2 Physical Applications of the Scanning Transmission Electron Miroscope / Part 3 Techniques for ParticulateMatter Studies in the Scanning Electron Microscope / Part 4 Microelectronic Device Fabrication and Quality Control with the Scanning Electron Microscope April 5-9, 1976 25830 edited by Om Johari edited by Om Johari IIT Research Institute 1976-01-01 00:00:00 +0900 1976 1901-01-01 09:00:00 +0900 2012-06-12 15:52:38 +0900 volume text unknown English 9780915802098 05865581 782p; 29cm 1 782 29.0 Guest "" "" "" "" "" "" "" "" "" "" 22296 Scanning electron microscopy "" "" "" "" "" "" "" 42080 1886 "" 2012-02-02 10:20:33 +0900 2023-06-26 17:35:48 +0900 "" "" "" "" "" 621.385.833 43684 205652 621.385.|Ｊ|5851 sengen S00110404 1977-02-10 00:00:00 +0900 2010-12-15 23:52:10 +0900 2010-12-15 23:52:10 +0900 3344 Practical Scanning Electron Microscopy. 62913 Goldstein.J.I. Yakowitz.H.' "" Plenum Press 1975-01-01 00:00:00 +0900 1975 2000-12-26 03:25:06 +0900 2024-03-04 13:47:31 +0900 volume text unknown English "" "" 582p; 23cm 1 582 23.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 3604 527900 621.385.||03410 namiki N00160203 1976-02-24 00:00:00 +0900 2010-12-15 20:30:31 +0900 2024-03-04 13:47:31 +0900 77060 Physical Aspects of Electron Microscopy and Microbeam Analysis: Jointly sponsored by the Electron Microscopy Society of America and the Microbeam Analysis Society 25842 edited by Benjamin M. Siegel, Donald R. Beaman edited by Benjamin M. Siegel, Donald R. Beaman John Wiley & Sons 1975-01-01 00:00:00 +0900 1901-01-01 09:00:00 +0900 2016-10-24 08:47:00 +0900 volume text unknown English 9780471790204 "" 474p; 27cm 1 474 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43579 205664 621.385.833|S|5820 sengen S00110405 1976-12-10 00:00:00 +0900 2010-12-15 23:51:41 +0900 2016-10-24 08:47:00 +0900 104070 Electron diffraction in the electron microscope "" "" J. W. Edington false J. W. Edington "" "" 1975-01-01 00:00:00 +0900 1975 2015-06-30 11:03:07 +0900 2022-02-07 17:08:47 +0900 volume text unknown English "" "" "" "" "" x, 122 p; 30cm "" Guest "" "" "" "" "" "" "" "" "" "" 25753 Monographs in practical electron microscopy in materials science "" "" "" Macmillan 2 false "" 104070 5266 "" 2015-06-30 11:03:08 +0900 2023-10-24 11:38:23 +0900 "" "" "" "" "" 621.385.833 83485 600500 621.385.833|M|2 sengen S00110404 "" 2015-06-30 00:00:00 +0900 2015-06-30 11:04:25 +0900 2022-02-07 17:08:47 +0900 42702 Principles and Practice of Electron Microscope Operation Vol.2 25826 Alan W. Agar, Ronald H. Alderson, Dawn Chescoe "" North−Holland 1974-01-01 00:00:00 +0900 1901-01-01 09:00:00 +0900 2011-04-27 14:12:28 +0900 volume text unknown English 9780720442540 "" Vol.2 345p; 23cm 1 345 23.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 44449 205648 621.385.833|G|6497 sengen S00110403 1979-09-05 00:00:00 +0900 2010-12-15 23:56:33 +0900 2011-04-27 14:12:28 +0900 104069 The operation and calibration of the electron microscope "" "" J.W. Edington false J.W. Edington "" Macmillan 1974-01-01 00:00:00 +0900 1974 2015-06-30 10:06:50 +0900 2016-12-12 21:24:11 +0900 volume text unknown English "" "" "" "" "" [5], 34 p; 30cm "" Guest "" "" "" "" "" "" "" "" "" "" 25752 Monographs in practical electron microscopy in materials science "" "" "" Macmillan 1 false "" 104069 5265 "" 2015-06-30 10:06:50 +0900 2023-10-24 11:38:23 +0900 "" "" "" "" "" 621.385.833 83484 600499 621.385.833|M|1 sengen S00110404 "" 2015-06-30 00:00:00 +0900 2015-06-30 10:16:43 +0900 2016-12-12 21:24:11 +0900 75851 Practical Methods in Electron Microscopy/ Specimen Preparation in Materials Science [Part 1]/ Electron Diffraction and Optical Diffraction Techniques [Part 2] Vol.1 Part 1.2 25825 P.J. Goodhew [Part 1]/ B.E.P. Beeston, Robert W. Horne and Roy Markham[Part 2] "" North-Holland 1972-01-01 00:00:00 +0900 1901-01-01 09:00:00 +0900 2011-04-03 02:22:33 +0900 volume text unknown English 9780720442519 "" Vol.1 444p; 23cm 1 444 23.0 Guest "" "" "" "" "" "" "" "" "" "" 293 Practical Methods in Electron Microscopy "" "" "" "" "" "" "" 75851 165 "" 2011-03-30 23:50:24 +0900 2013-05-24 16:48:32 +0900 "" "" "" "" "" 621.385.833 44448 205647 621.385.833|G|6496 sengen S00110403 1979-09-05 00:00:00 +0900 2010-12-15 23:56:33 +0900 2010-12-15 23:56:33 +0900 39546 先端材料評価のための電子顕微鏡技法 センタン ザイリョウ ヒョウカ ノ タメノ デンシ ケンビキョウ ギホウ 30822 日本電子顕微鏡学会関東支部 日本電子顕微鏡学会関東支部 朝倉書店 1901-12-31 09:00:00 +0900 2022-04-07 17:41:25 +0900 volume text unknown Japanese 9784254200539 "" 382p; 27cm 1 382 27.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 40849 212763 621.385.833|N|ｷ 496 sengen S00110404 1993-01-07 00:00:00 +0900 2010-12-15 23:38:52 +0900 2022-04-07 17:41:25 +0900