manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	serial	manifestation_identifier	creator	contributor	publisher	date_of_publication	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	ncid	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	doi	jpno	ncid	lccn	iss_itemno	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
38140	Diffusion and Defect Data Pt.A Defect and Diffusion Forum Vol.150-151  Vol.150-151		  			33750	J. Cibert [et al. editors]	""	Scitec Publications				1901-01-01 09:00:00 +0900	2010-12-27 05:10:39 +0900	volume	text	unknown	English	""	""									358p; 25cm	1	358		25.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	548.526						39078	217536		548.526|Ｄ|10418	sengen	S00080503			1997-11-17 00:00:00 +0900	2010-12-15 23:29:54 +0900	2010-12-15 23:29:54 +0900
41282	Gettering and Defect Engineering in Semiconductor Technology GADEST 2001 : Proceedings of the 9th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology, S. Tecla, Italy September 30-October 3, 2001  Vols. 82-84		  			66587	Editor: V. Raineri, F. Priolo, M. Kittler and H. Richter	""	Scitec Publications Ltd	2002-01-01 00:00:00 +0900	2002		1901-01-01 09:00:00 +0900	2012-06-12 15:52:35 +0900	volume	text	unknown	English	9783908450641	10120394			Vols.82-84						823p; 25cm	1	823		25.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	548.526						42750	219032		548.526|D|11571	sengen	S00090101			2001-11-29 00:00:00 +0900	2010-12-15 23:47:47 +0900	2010-12-15 23:47:47 +0900
72003	Defects in Semiconductors Ⅰ NCDS -1： Proceedings of The 1st National Conference on Defects in Semiconductors, held in St.Petersburg, Russia, April 26-30, 1992		  			32679	Nickolay T. Bagraev [editor]	""	Scitec Publications				1901-01-01 09:00:00 +0900	2010-12-27 06:19:14 +0900	volume	text	unknown	English	9780878496662	""									678p; 25cm	1	678		25.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	537.311						38528	216465		537.311|B|T-1530	sengen	S00030504			1994-03-30 00:00:00 +0900	2010-12-15 23:27:08 +0900	2010-12-15 23:27:08 +0900