manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	manifestation_identifier	creator	contributor	publisher	date_of_publication	pub_date	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	doi	jpno	ncid	lccn	iss_itemno	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
115914	感覚・知覚・認知の基礎	Sensation, perception and cognition : an introduction//感覚知覚認知の基礎	カンカク・チカク・ニンチ ノ キソ	電子情報通信学会編		乾, 敏郎//電子情報通信学会	""	オーム社		2012-01	2012		2017-01-16 16:04:15 +0900	2025-12-15 09:45:51 +0900	volume	text	unknown	Japanese	9784274211492	""			BB08027012										xiv, 263p ; 21cm									Guest			""	""	""	""	""	""	""	""	""	""	69684	現代電子情報通信選書 : 知識の森	""	ゲンダイ デンシ ジョウホウ ツウシン センショ : チシキ ノ モリ	""	""	""	""	""	115914	16638	""	2024-11-28 21:40:22 +0900	2026-03-04 11:14:56 +0900	""	""	""	""	""	621.821	83808	600843		621.821|I|	sengen	S00990909			2016-03-25 00:00:00 +0900	2017-01-16 16:05:50 +0900	2025-05-12 09:53:48 +0900
115914	感覚・知覚・認知の基礎	Sensation, perception and cognition : an introduction//感覚知覚認知の基礎	カンカク・チカク・ニンチ ノ キソ	電子情報通信学会編		乾, 敏郎//電子情報通信学会	""	オーム社		2012-01	2012		2017-01-16 16:04:15 +0900	2025-12-15 09:45:51 +0900	volume	text	unknown	Japanese	9784274211492	""			BB08027012										xiv, 263p ; 21cm									Guest			""	""	""	""	""	""	""	""	""	""	69684	現代電子情報通信選書 : 知識の森	""	ゲンダイ デンシ ジョウホウ ツウシン センショ : チシキ ノ モリ	""	""	""	""	""	115914	16638	""	2024-11-28 21:40:22 +0900	2026-03-04 11:14:56 +0900	""	""	""	""	""	621.821	83954	600904		621.821|I|	namiki	N00230402			2016-03-25 00:00:00 +0900	2017-02-08 14:58:47 +0900	2025-12-15 09:45:51 +0900
114899	量子力学概論	Quantum Mechanics : an introduction//Theoretische Physik	リョウシ リキガク ガイロン	W.グライナー著 ; 川島直輝 [ほか] 訳		Greiner, Walter//伊藤, 伸泰//早野, 龍五//川島, 直輝//河原林, 透//野々村, 禎彦//羽田野, 直道//古川, 信夫	""	丸善出版		2012-01	2012		2016-05-13 19:18:15 +0900	2025-12-15 09:27:36 +0900	volume	text	unknown	Japanese	9784621065532//9784621062463	""			BB08574886				: 新装版						xiii, 457p ; 24cm									Guest			""	""	""	""	""	""	""	""	""	""	66637	Springer university textbooks	""	""	""	""	""	""	""	114899	13632	""	2024-11-28 21:06:19 +0900	2026-03-04 11:14:56 +0900	""	""	""	""	""	530.145	83730	600433		530.145|G|	namiki	N00060506	""		2015-05-11 00:00:00 +0900	2016-05-13 19:20:43 +0900	2025-12-15 09:27:36 +0900
105475	Everything SAXS: Small-angle scattering pattern collection and correction					""	""	""					2015-12-15 21:32:23 +0900	2025-07-14 15:47:36 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758219	Guest	"  For obtaining reliable nanostructural details of large amounts of sample ---
and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique
to use. It promises to obtain bulk-scale, statistically sound information on
the morphological details of the nanostructure, and has thus led to many a
researcher investing their time in it over the last eight decades of
development. Due to pressure both from scientists requesting more details on
increasingly complex nanostructures, as well as the ever improving
instrumentation leaving less margin for ambiguity, small-angle scattering
methodologies have been evolving at a high pace over the last few decades.
  As the quality of any results can only be as good as the data that goes into
these methodologies, the improvements in data collection and all imaginable
data correction steps are reviewed here. This work is intended to provide a
comprehensive overview of all data corrections, to aid the small-angle
scatterer to decide which are relevant for their measurement and how these
corrections are performed. Clear mathematical descriptions of the corrections
are provided where feasible. Furthermore, as no quality data exists without a
decent estimate of its precision, the error estimation and propagation through
all these steps is provided alongside the corrections. With these data
corrections, the collected small-angle scattering pattern can be made of the
highest standard allowing for authoritative nanostructural characterisation
through its analysis. A brief background of small-angle scattering, the
instrumentation developments over the years, and pitfalls that may be
encountered upon data interpretations are provided as well.
"		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det	""	""	""	""	104494				web	web				2025-07-14 15:02:37 +0900	2025-07-14 15:47:36 +0900
105470	Everything SAXS: Small-angle scattering pattern collection and correction					""	""	""					2015-12-15 21:32:16 +0900	2025-07-14 15:47:35 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758203	Guest	"  For obtaining reliable nanostructural details of large amounts of sample ---
and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique
to use. It promises to obtain bulk-scale, statistically sound information on
the morphological details of the nanostructure, and has thus led to many a
researcher investing their time in it over the last eight decades of
development. Due to pressure both from scientists requesting more details on
increasingly complex nanostructures, as well as the ever improving
instrumentation leaving less margin for ambiguity, small-angle scattering
methodologies have been evolving at a high pace over the last few decades.
  As the quality of any results can only be as good as the data that goes into
these methodologies, the improvements in data collection and all imaginable
data correction steps are reviewed here. This work is intended to provide a
comprehensive overview of all data corrections, to aid the small-angle
scatterer to decide which are relevant for their measurement and how these
corrections are performed. Clear mathematical descriptions of the corrections
are provided where feasible. Furthermore, as no quality data exists without a
decent estimate of its precision, the error estimation and propagation through
all these steps is provided alongside the corrections. With these data
corrections, the collected small-angle scattering pattern can be made of the
highest standard allowing for authoritative nanostructural characterisation
through its analysis. A brief background of small-angle scattering, the
instrumentation developments over the years, and pitfalls that may be
encountered upon data interpretations are provided as well.
"		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det	""	""	""	""	104489				web	web				2025-07-14 15:02:36 +0900	2025-07-14 15:47:35 +0900
105467	Everything SAXS: Small-angle scattering pattern collection and correction					""	""	""					2015-12-15 21:32:11 +0900	2025-07-14 15:47:35 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758199	Guest	"  For obtaining reliable nanostructural details of large amounts of sample ---
and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique
to use. It promises to obtain bulk-scale, statistically sound information on
the morphological details of the nanostructure, and has thus led to many a
researcher investing their time in it over the last eight decades of
development. Due to pressure both from scientists requesting more details on
increasingly complex nanostructures, as well as the ever improving
instrumentation leaving less margin for ambiguity, small-angle scattering
methodologies have been evolving at a high pace over the last few decades.
  As the quality of any results can only be as good as the data that goes into
these methodologies, the improvements in data collection and all imaginable
data correction steps are reviewed here. This work is intended to provide a
comprehensive overview of all data corrections, to aid the small-angle
scatterer to decide which are relevant for their measurement and how these
corrections are performed. Clear mathematical descriptions of the corrections
are provided where feasible. Furthermore, as no quality data exists without a
decent estimate of its precision, the error estimation and propagation through
all these steps is provided alongside the corrections. With these data
corrections, the collected small-angle scattering pattern can be made of the
highest standard allowing for authoritative nanostructural characterisation
through its analysis. A brief background of small-angle scattering, the
instrumentation developments over the years, and pitfalls that may be
encountered upon data interpretations are provided as well.
"		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det	""	""	""	""	104486				web	web				2025-07-14 15:02:36 +0900	2025-07-14 15:47:35 +0900
105465	"Everything SAXS: Small-angle scattering pattern collection and
  correction"					""	""	""					2015-12-15 21:32:09 +0900	2025-07-14 15:47:34 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758193	Guest	"  For obtaining reliable nanostructural details of large amounts of sample ---
and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique
to use. It promises to obtain bulk-scale, statistically sound information on
the morphological details of the nanostructure, and has thus led to many a
researcher investing their time in it over the last eight decades of
development. Due to pressure both from scientists requesting more details on
increasingly complex nanostructures, as well as the ever improving
instrumentation leaving less margin for ambiguity, small-angle scattering
methodologies have been evolving at a high pace over the last few decades.
  As the quality of any results can only be as good as the data that goes into
these methodologies, the improvements in data collection and all imaginable
data correction steps are reviewed here. This work is intended to provide a
comprehensive overview of all data corrections, to aid the small-angle
scatterer to decide which are relevant for their measurement and how these
corrections are performed. Clear mathematical descriptions of the corrections
are provided where feasible. Furthermore, as no quality data exists without a
decent estimate of its precision, the error estimation and propagation through
all these steps is provided alongside the corrections. With these data
corrections, the collected small-angle scattering pattern can be made of the
highest standard allowing for authoritative nanostructural characterisation
through its analysis. A brief background of small-angle scattering, the
instrumentation developments over the years, and pitfalls that may be
encountered upon data interpretations are provided as well.
"		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det	""	""	""	""	104484				web	web				2025-07-14 15:02:36 +0900	2025-07-14 15:47:34 +0900
105416	"Heat-induced breakage of an optical circuit at a TeO2
glass bridge linking silica glass fibers"					TODOROKI, Shin-ichi	""	""	2006-08-01 00:00:00 +0900	2006-08-01	2006		2015-12-15 21:30:36 +0900	2025-07-14 15:47:29 +0900	online_resource	text	unknown	English	""	""														709	712						https://hdl.handle.net/20.500.11932/28314	Guest	"The irreversible transformation of a tellurum oxide glass layer
inserted between two ends of two silica glass optical fibers was
monitored via the intensity of a light passed through the circuit.  This
structure is used for a heat-induced optical fuse after the soft glass
layer has been coated with a light absorber.  Heat-induced breakage
occurred when the glass crystallized or flowed in the presence of a
shearing stress.  Without the stress, the optical link was maintained
through the glass melt but suddenly broke due to the crystallization.
On the other hand, the stress deformed the glass bridge and broke the
optical link less than 0.4 sec.  Thus, the shearing stress at the
splicing point helps the device respond immediately and reliably."		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	optical fiber//telluria glass//plastic flow//optical fuse	""	""	""	""	104446				web	web				2025-07-14 15:02:31 +0900	2025-07-14 15:47:29 +0900
105410	An Application of the NTCIR-WEB Raw-data Archive Dataset for User Experiments					""	""	""	2007-05-15 00:00:00 +0900	2007-05-15	2007		2015-12-15 21:30:30 +0900	2025-07-14 15:47:29 +0900	online_resource	text	unknown	English	""	""																					https://hdl.handle.net/20.500.11932/28303	Guest	"This paper presents a simple approach to utilize
past test collections as a material for user experiments.
We have built a Web-based user interface for
NTCIR-5 WEB run results, and conducted a user experiment
with 29 subjects to investigate whether performance
evaluation metrics of information retrieval
systems used in test collections such as TREC and NTCIR
comparable to user performance. In this experiment,
we selected three types of systems from among
systems that participated in NTCIR-5 WEB, and then
selected three topics with roughly the same values from
among several search topics. The results of the experiment
showed no significant differences among these
systems and topics in the time for search. While, in
general, the user experiment itself have been successfully
conducted and shown similar trends with prior
study, the approach seems to have some limitations
mainly on interactivity and cached page display."		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	Evaluation//User experiments//User interface//Rawdata archive//Web information retrieval//Evaluation//User experiments//User interface//Rawdata archive//Web information retrieval//Evaluation//User experiments//User interface//Rawdata archive//Web information retrieval	""	""	""	""	104443				web	web				2025-07-14 15:02:31 +0900	2025-07-14 15:47:29 +0900
104308	Mechanics	""	""	by Keith R. Symon		Symon, Keith R.	""	Addison-Wesley Pub. Co		1960	1960		2015-12-11 14:31:12 +0900	2026-03-13 15:35:30 +0900	volume	text	unknown	English	""	""			BA10070899					2	2nd ed				xiv, 557 p. ; 24 cm									Guest			""	""	""	""	""	""	""	""	""	""	62626	Addison-Wesley series in physics	""	""	""	""	""	""	""	104308	10057	""	2024-11-28 20:29:19 +0900	2025-10-15 15:07:18 +0900	""	""	""	""	""	""	83690	600703		531|S|	namiki	N00070103	""		2016-01-04 00:00:00 +0900	2015-12-11 14:32:18 +0900	2026-03-13 15:35:30 +0900
104229	An introduction to thermodynamics, the kinetic theory of gases, and statistical mechanics	""	""	by Francis Weston Sears		Sears, Francis Weston	""	Addison-Wesley Pub. Co.		1953	1953		2015-09-30 10:33:29 +0900	2025-12-15 09:29:26 +0900	volume	text	unknown	English	""	""			BA10914593					2	2nd ed				x, 374 p. ; 22 cm									Guest			""	""	""	""	""	""	""	""	""	""	62827	Addison-Wesley world student series	""	""	""	""	""	""	""	104229	10246	""	2024-11-28 20:31:46 +0900	2026-03-04 11:14:56 +0900	""	""	""	""	""	536.7	83637	600649		536.7|S|	namiki	N00080405	""		2015-10-09 00:00:00 +0900	2015-09-30 10:34:36 +0900	2025-12-15 09:29:26 +0900