manifestation_id original_title title_alternative title_transcription statement_of_responsibility serial manifestation_identifier creator contributor publisher date_of_publication year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn ncid volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc doi jpno ncid lccn iss_itemno item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 40991 Proceedings of the 18th International Conference Defects in Semiconductors Part 4; ICDS 18 Sendai, Japan, July 23-28, 1995 Part 4 68197 edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida Trans Tech Publications 1995-01-01 00:00:00 +0900 1995 2002-09-04 23:49:53 +0900 2012-06-26 17:08:05 +0900 volume text unknown English 9780878497157 "" 18 18 1563p; 25cm 1 1563 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.315.592 42418 219286 621.315.|D|キ1200 sengen S00110205 2002-07-08 00:00:00 +0900 2010-12-15 23:46:13 +0900 2012-06-26 17:08:05 +0900 43354 Proceedings of the 18th International conference Defects in Semiconductors Part 3; ICDS 18 Sendai, Japan, July 23-28, 1995 Part 3 68196 edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida Trans Tech Publications 1995-01-01 00:00:00 +0900 1995 2002-09-04 23:44:53 +0900 2012-06-26 17:08:39 +0900 volume text unknown English 9780878497140 "" 18 18 1109p; 25cm 1 1109 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.315.592 45178 219285 621.315.|D|キ1199 sengen S00110205 2002-07-08 00:00:00 +0900 2010-12-16 00:00:53 +0900 2012-06-26 17:08:39 +0900 40989 Proceedings of the 18th International Conference on Defects in Semiconductors Part 1; ICDS-18 Sendai, Japan, July 23-28, 1995 Part1 68194 edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida Trans Tech Publications 1995-01-01 00:00:00 +0900 1995 2002-09-04 23:28:13 +0900 2012-06-26 17:08:05 +0900 volume text unknown English 9780878497126 "" 18 18 1p; 25cm 1 1 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.315.592 42416 219283 621.315.|D|キ1197 sengen S00110205 2002-07-08 00:00:00 +0900 2010-12-15 23:46:13 +0900 2012-06-26 17:08:05 +0900 40990 Proceedings of the 18th International Conference on Defects in Semiconductors Part 2; ICDS 18 Sendai, Japan, July 23-28, 1995 Part 2 68192 edited by;Masashi Suezawa and Hiroshi Katayama-Yoshida edited by;Masashi Suezawa and Hiroshi Katayama-Yoshida Trance Tech Publications 1995-01-01 00:00:00 +0900 1995 2002-09-04 23:13:10 +0900 2012-06-26 17:08:05 +0900 volume text unknown English 9780878497133 "" 18 18 579p; 25cm 1 579 25.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.315.592 42417 219284 621.315.|D|キ1198 sengen S00110205 2002-07-08 00:00:00 +0900 2010-12-15 23:46:13 +0900 2012-06-26 17:08:05 +0900