manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	serial	manifestation_identifier	creator	contributor	publisher	date_of_publication	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	ncid	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	doi	jpno	ncid	lccn	iss_itemno	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
104137	電子顕微鏡法の実践と応用写真集	Practical electron microscopy and its application to materials	デンシ ケンビキョウホウ ノ ジッセン ト オウヨウ シャシンシュウ	日本鉄鋼協会, 日本金属学会	false		""	日本鉄鋼協会, 日本金属学会	日本金属学会	2002-03-01 00:00:00 +0900	2002		2015-07-30 13:58:39 +0900	2018-01-29 11:04:51 +0900	volume	text	unknown	Japanese	""	""			""		""		""		xvi, 254p; 30cm								""	Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						83568	600584		621.385.833|N| 	sengen	S00110404	""		2015-07-30 00:00:00 +0900	2015-07-30 14:00:00 +0900	2018-01-29 11:04:51 +0900
65871	電子顕微鏡研究者のための  FIB・イオンミリング技法Q&A：ナノテクノロジーの推進役		デンシ ケンビキョウ ケンキュウシャ ノ タメ ノ FIB・イオン ミリ ング ギホウ Q&A:ナノ テクノロジー ノ スイシンヤク  			920868	平坂 雅夫//朝倉 健太郎  共編	""	アグネ承風社	2002-01-01 00:00:00 +0900	2002		2007-10-18 22:35:29 +0900	2024-03-04 14:00:58 +0900	volume	text	unknown	Japanese	9784900508743	""					第一版					1	208		0.0	0.0	0.0			Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						74514	211003		621.385.833|H|12455	sengen	S00110403			2007-10-12 00:00:00 +0900	2010-12-16 02:32:45 +0900	2024-03-04 14:00:58 +0900
42605	Characterization of Radiation Damage by Transmission Electron Microscopy		  			67494	M.L. Jenkins, M.A. Kirk	""	Institute of Physics (IOP)	2001-01-01 00:00:00 +0900			2002-01-30 02:08:45 +0900	2024-03-04 14:00:59 +0900	volume	text	unknown	English	9780750307482	""			Science						224p; 24cm	1	224		24.0					Guest			""	""	""	""	""	""	""	""	""	""	1197	Series in Microscopy in Materials Science	""	""	""	""	""	""	""	42605	662	""	2011-03-30 23:56:45 +0900	2013-04-22 23:56:50 +0900	""	""	""	""	""	621.385.833						44311	219114		621.385.|J|11641	sengen	S00110403			2002-02-07 00:00:00 +0900	2010-12-15 23:55:44 +0900	2024-03-04 14:00:59 +0900