manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 39112 Properties Silicon Germanium and Sige : Carbon "" "" 36425 Erich Kasper, Klara Lyutovich (Ed.) "" INSPEC, Institution of Electrical Engineers(IEE) 2000-01-01 00:00:00 +0900 2000 "" 1901-01-01 09:00:00 +0900 2023-02-24 17:01:25 +0900 volume text unknown English 9780852967836 "" "" "" "" 358p; 29cm 1 358 29.0 32508 "" Guest "" "" "" "" "" "" "" "" "" "" 27038 EMIS datareviews series "" "" "" "" no.24 false "" 39112 6454 "" 2022-08-24 10:56:23 +0900 2024-05-30 10:36:45 +0900 "" "" "" "" "" 537.311 40153 218569 537.311|W|24 sengen S00040101 "" 2000-11-28 00:00:00 +0900 2010-12-15 23:35:36 +0900 2023-02-24 17:01:25 +0900 69188 Properties of Crystalline Silicon "" "" 35120 edited by Robert Hull edited by Robert Hull INSPEC, The Institution of Electrical Engineers(IEE) 1999-01-01 00:00:00 +0900 1999 "" 2000-01-20 22:52:50 +0900 2023-02-24 17:00:30 +0900 volume text unknown English 9780852969335 "" "" "" "" 1016p; 29cm 1 1016 29.0 "" Guest "" "" "" "" "" "" "" "" "" "" 27037 EMIS datareviews series "" "" "" "" no.20 false "" 69188 6453 "" 2022-08-24 10:54:32 +0900 2024-05-30 10:36:45 +0900 "" "" "" "" "" 537.311 43926 218191 537.311|W|20 sengen S00040101 "" 2000-02-21 00:00:00 +0900 2010-12-15 23:53:23 +0900 2023-02-24 17:00:30 +0900 69444 Properties Processing and Applications of Gallium Nitride and Related Semiconductors No.23 36423 James H. Edgar, Samuel (Toby) Strite, Isamu Akasaki, Hiroshi Amano, Christian Wetzel (Ed.) "" INSPEC, Institution of Electrical Engineers(IEE) 1999-01-01 00:00:00 +0900 2000-10-30 22:53:55 +0900 2011-04-03 04:37:48 +0900 volume text unknown English 9780852969533 "" No.23 656p; 29cm 1 656 29.0 37611 Guest "" "" "" "" "" "" "" "" "" "" 742 Electronic Materials Information Service (EMIS) Datareviews Series "" "" "" "" "" "" "" 69444 395 "" 2011-03-30 23:53:53 +0900 2013-05-24 16:45:28 +0900 "" "" "" "" "" 544.03 40151 218567 544.03|E|11250 sengen S00070304 2000-11-28 00:00:00 +0900 2010-12-15 23:35:36 +0900 2010-12-15 23:35:36 +0900 65921 Properties of Amorphous Silicon and its Alloys "" "" 71864 edited by Tim Searle edited by Tim Searle INSPEC, The Institution of Electrical Engineers(IEE) 1998-01-01 00:00:00 +0900 1998 "" 2004-08-06 00:33:39 +0900 2023-02-24 17:00:30 +0900 volume text unknown English "" "" "" "" "" 412p; 29cm 1 412 29.0 "" Guest "" "" "" "" "" "" "" "" "" "" 27035 EMIS datareviews series "" "" "" "" no.19 false "" 65921 6451 "" 2022-08-24 10:51:16 +0900 2024-05-30 10:36:45 +0900 "" "" "" "" "" 537.311 69801 219652 537.311|W|19 sengen S00040101 "" 2004-08-04 00:00:00 +0900 2010-12-16 02:08:33 +0900 2023-02-24 17:00:30 +0900 132813 Properties, processing and applications of glass and rare earth-doped glasses for optical fibres "" "" edited by Dan Hewak Hewak, Dan "" INSPEC 1998-01-01 00:00:00 +0900 1998 London 2024-04-10 16:58:17 +0900 2024-04-23 15:55:33 +0900 volume unknown English 9780852969526 "" BA43115959 xix, 376 p. ; 29 cm Guest "" "" "" "" "" "" "" "" "" "" 31846 EMIS datareviews series "" "" "" "" no.22 "" "" 132813 11231 "" 2024-04-10 16:58:17 +0900 2024-05-30 10:36:45 +0900 "" "" "" "" "" 666.1 103269 603033 666.1|H| namiki N00160404 2021-08-19 00:00:00 +0900 2024-04-10 16:58:17 +0900 2024-04-23 15:55:33 +0900 66030 Properties of Porous Silicon "" "" 71871 edited by Leigh Chanham edited by Leigh Chanham INSPEC, The Institution of Electrical Engineers(IEE) 1997-01-01 00:00:00 +0900 1997 "" 2004-08-10 20:58:56 +0900 2023-02-24 17:00:30 +0900 volume text unknown English 9780852969328 "" "" "" "" 405p; 29cm 1 405 29.0 "" Guest "" "" "" "" "" "" "" "" "" "" 27036 EMIS datareviews series "" "" "" "" no.18 false "" 66030 6452 "" 2022-08-24 10:52:48 +0900 2024-05-30 10:36:45 +0900 "" "" "" "" "" 537.311 69813 219663 537.311|W|18 sengen S00040101 "" 2004-08-18 00:00:00 +0900 2010-12-16 02:08:38 +0900 2023-02-24 17:00:30 +0900 39109 Properties of Gallium Arsenide -3rd ed.- No.16 36422 M.R. Brozel, G.E. Stillman (Ed.) "" INSPEC, Institution of Electrical Engineers(IEE) 1996-01-01 00:00:00 +0900 2000-10-28 01:58:58 +0900 2022-05-09 12:19:54 +0900 volume text unknown English 9780852968857 "" No.16 981p; 29cm 1 981 29.0 51576 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 544.03 40150 218566 544.03|B|11249 sengen S00070304 2000-11-28 00:00:00 +0900 2010-12-15 23:35:35 +0900 2022-05-09 12:19:54 +0900 39111 Properties of Ⅲ-Ⅴ Quantum Wells and Superlattices No.15 36424 Pallab Bhattacharya (Ed.) "" INSPEC, Institution of Electrical Engineers(IEE) 1996-01-01 00:00:00 +0900 2000-10-31 00:54:18 +0900 2011-04-03 02:26:41 +0900 volume text unknown English 9780852968819 "" No.15 400p; 29cm 1 400 29.0 32508 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 544.03 40152 218568 544.03|B|11251 sengen S00070304 2000-11-28 00:00:00 +0900 2010-12-15 23:35:36 +0900 2010-12-15 23:35:36 +0900 40680 Properties of Silicon Carbide "" "" 33178 edited by Gary L. Harris edited by Gary L. Harris INSPEC, The Institution of Electrical Engineers(IEE) 1995-01-01 00:00:00 +0900 1995 "" 1901-12-31 09:00:00 +0900 2023-02-24 17:00:30 +0900 volume text unknown English 9780852968703 "" "" "" "" 282p; 29cm 1 282 29.0 "" Guest "" "" "" "" "" "" "" "" "" "" 27034 EMIS datareviews series "" "" "" "" no.13 false "" 40680 6450 "" 2022-08-24 10:49:00 +0900 2024-05-30 10:36:45 +0900 "" "" "" "" "" 537.311 42028 216964 537.311|W|13 sengen S00040101 "" 1996-06-05 00:00:00 +0900 2010-12-15 23:44:24 +0900 2023-02-24 17:00:30 +0900 40681 Properties of Metal Silicides "" "" 34978 edited by Karen Maex and Marc Van Rossum edited by Karen Maex and Marc Van Rossum INSPEC， The Institution of Electrical Engineers(IEE) 1995-01-01 00:00:00 +0900 1995 "" 1999-11-12 20:00:43 +0900 2023-02-24 17:03:09 +0900 volume text unknown English 9780852968598 "" "" "" "" 335p; 29cm 1 335 29.0 "" Guest "" "" "" "" "" "" "" "" "" "" 27031 EMIS datareviews series "" "" "" "" no.14 false "" 40681 6447 "" 2022-08-24 10:39:17 +0900 2024-05-30 10:36:45 +0900 "" "" "" "" "" 537.311 42029 216880 537.311|W|14 sengen S00040101 "" 1996-02-26 00:00:00 +0900 2010-12-15 23:44:24 +0900 2023-02-24 17:03:09 +0900 40681 Properties of Metal Silicides "" "" 34978 edited by Karen Maex and Marc Van Rossum edited by Karen Maex and Marc Van Rossum INSPEC， The Institution of Electrical Engineers(IEE) 1995-01-01 00:00:00 +0900 1995 "" 1999-11-12 20:00:43 +0900 2023-02-24 17:03:09 +0900 volume text unknown English 9780852968598 "" "" "" "" 335p; 29cm 1 335 29.0 "" Guest "" "" "" "" "" "" "" "" "" "" 27031 EMIS datareviews series "" "" "" "" no.14 false "" 40681 6447 "" 2022-08-24 10:39:17 +0900 2024-05-30 10:36:45 +0900 "" "" "" "" "" 537.311 42030 217436 537.311|W|14 sengen S00040101 "" 1997-04-10 00:00:00 +0900 2010-12-15 23:44:24 +0900 2023-02-24 17:03:09 +0900