manifestation_id original_title title_alternative title_transcription statement_of_responsibility serial manifestation_identifier creator contributor publisher date_of_publication year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn ncid volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc doi jpno ncid lccn iss_itemno item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 132813 Properties, processing and applications of glass and rare earth-doped glasses for optical fibres "" "" edited by Dan Hewak Hewak, Dan "" INSPEC 1998-01-01 00:00:00 +0900 1998 London 2024-04-10 16:58:17 +0900 2024-04-23 15:55:33 +0900 volume unknown English 9780852969526 "" BA43115959 xix, 376 p. ; 29 cm Guest "" "" "" "" "" "" "" "" "" "" 31846 EMIS datareviews series "" "" "" "" no.22 "" "" 132813 11232 "" 2024-04-10 16:58:17 +0900 2024-04-10 16:58:17 +0900 "" "" "" "" "" 666.1 BA43115959 103269 603033 666.1|H| namiki N00160404 2021-08-19 00:00:00 +0900 2024-04-10 16:58:17 +0900 2024-04-23 15:55:33 +0900 66201 Properties of Strained and Relaxed Silicon Germanium "" "" false 71876 edited by Erich Kasper edited by Erich Kasper INSPEC, IEE 1995-01-01 00:00:00 +0900 1995 "" 2004-08-11 20:21:18 +0900 2023-02-24 17:00:30 +0900 volume text unknown English 9780852968260 "" "" "" "" 232p; 29cm 1 232 29.0 "" Guest "" "" "" "" "" "" "" "" "" "" 27033 EMIS datareviews series "" "" "" "" no.12 false "" 66201 6450 "" 2022-08-24 10:47:03 +0900 2023-11-24 14:57:25 +0900 "" "" "" "" "" 537.311 69828 219673 537.311|W|12 sengen S00040101 "" 2004-09-24 00:00:00 +0900 2010-12-16 02:08:43 +0900 2023-02-24 17:00:30 +0900 66030 Properties of Porous Silicon "" "" false 71871 edited by Leigh Chanham edited by Leigh Chanham INSPEC, The Institution of Electrical Engineers(IEE) 1997-01-01 00:00:00 +0900 1997 "" 2004-08-10 20:58:56 +0900 2023-02-24 17:00:30 +0900 volume text unknown English 9780852969328 "" "" "" "" 405p; 29cm 1 405 29.0 "" Guest "" "" "" "" "" "" "" "" "" "" 27036 EMIS datareviews series "" "" "" "" no.18 false "" 66030 6453 "" 2022-08-24 10:52:48 +0900 2023-11-24 14:57:25 +0900 "" "" "" "" "" 537.311 69813 219663 537.311|W|18 sengen S00040101 "" 2004-08-18 00:00:00 +0900 2010-12-16 02:08:38 +0900 2023-02-24 17:00:30 +0900 65921 Properties of Amorphous Silicon and its Alloys "" "" false 71864 edited by Tim Searle edited by Tim Searle INSPEC, The Institution of Electrical Engineers(IEE) 1998-01-01 00:00:00 +0900 1998 "" 2004-08-06 00:33:39 +0900 2023-02-24 17:00:30 +0900 volume text unknown English "" "" "" "" "" 412p; 29cm 1 412 29.0 "" Guest "" "" "" "" "" "" "" "" "" "" 27035 EMIS datareviews series "" "" "" "" no.19 false "" 65921 6452 "" 2022-08-24 10:51:16 +0900 2023-11-24 14:57:25 +0900 "" "" "" "" "" 537.311 69801 219652 537.311|W|19 sengen S00040101 "" 2004-08-04 00:00:00 +0900 2010-12-16 02:08:33 +0900 2023-02-24 17:00:30 +0900 5436 EMIS Datareviews Series No.9 (Properties and Growth of Diamond) "" EMIS Datareviews Series No.9@(Electronic Materials Information Service) 65828 Davies.G.' "" IEE Inspec 1994-01-01 00:00:00 +0900 1994 2001-07-13 03:59:08 +0900 2012-09-18 13:43:36 +0900 volume text unknown English "" "" "" "" 437p; 28cm 1 437 28.0 "" Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 546.26 5889 527021 546.26|| namiki N00990909 "" 1994-08-18 00:00:00 +0900 2010-12-15 20:42:15 +0900 2012-09-18 13:43:52 +0900 4583 Electronic Materials Information Service No.13 (Properties of Silicon Carbide) Electronic Materials Information Service No.13 (Properties of Silicon Carbide) 64951 Harris.G.L.' "" INSPEC 1995-01-01 00:00:00 +0900 1995 2000-12-26 03:43:12 +0900 2023-02-24 16:48:49 +0900 volume text unknown English "" "" 282p; 28cm 1 282 28.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 546.2 4923 527069 546.2||05474 namiki N00990909 2000-04-18 00:00:00 +0900 2010-12-15 20:37:13 +0900 2023-02-24 16:48:49 +0900 3361 Properties of Lithium Niobate. (EMIS Datareviews Series. No.5) 64356 The Institution of Electrical Engineers. "" INSPEC. 1989-01-01 00:00:00 +0900 1989 2000-12-26 03:26:42 +0900 2024-03-04 13:47:45 +0900 volume text unknown English "" "" 364p; 28cm 1 364 28.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 666.65 3771 527454 666.65||04867 namiki N00170205 1991-02-05 00:00:00 +0900 2010-12-15 20:31:18 +0900 2024-03-04 13:47:45 +0900 39111 Properties of Ⅲ-Ⅴ Quantum Wells and Superlattices No.15 36424 Pallab Bhattacharya (Ed.) "" INSPEC, Institution of Electrical Engineers(IEE) 1996-01-01 00:00:00 +0900 2000-10-31 00:54:18 +0900 2011-04-03 02:26:41 +0900 volume text unknown English 9780852968819 "" No.15 400p; 29cm 1 400 29.0 32508 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 544.03 40152 218568 544.03|B|11251 sengen S00070304 2000-11-28 00:00:00 +0900 2010-12-15 23:35:36 +0900 2010-12-15 23:35:36 +0900 69444 Properties Processing and Applications of Gallium Nitride and Related Semiconductors No.23 36423 James H. Edgar, Samuel (Toby) Strite, Isamu Akasaki, Hiroshi Amano, Christian Wetzel (Ed.) "" INSPEC, Institution of Electrical Engineers(IEE) 1999-01-01 00:00:00 +0900 2000-10-30 22:53:55 +0900 2011-04-03 04:37:48 +0900 volume text unknown English 9780852969533 "" No.23 656p; 29cm 1 656 29.0 37611 Guest "" "" "" "" "" "" "" "" "" "" 742 Electronic Materials Information Service (EMIS) Datareviews Series "" "" "" "" "" "" "" 69444 395 "" 2011-03-30 23:53:53 +0900 2013-05-24 16:45:28 +0900 "" "" "" "" "" 544.03 40151 218567 544.03|E|11250 sengen S00070304 2000-11-28 00:00:00 +0900 2010-12-15 23:35:36 +0900 2010-12-15 23:35:36 +0900 39109 Properties of Gallium Arsenide -3rd ed.- No.16 36422 M.R. Brozel, G.E. Stillman (Ed.) "" INSPEC, Institution of Electrical Engineers(IEE) 1996-01-01 00:00:00 +0900 2000-10-28 01:58:58 +0900 2022-05-09 12:19:54 +0900 volume text unknown English 9780852968857 "" No.16 981p; 29cm 1 981 29.0 51576 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 544.03 40150 218566 544.03|B|11249 sengen S00070304 2000-11-28 00:00:00 +0900 2010-12-15 23:35:35 +0900 2022-05-09 12:19:54 +0900