manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 30675 Electromagnetic testing : eddy current, flux leakage, and microwave nondestructive testing Robert C. McMaster, editor emeritus, Paul McIntire, editor, Michael L. Mester, technical editor 21199 McMaster, Robert Charles//McIntire, Paul//Mester, Michael L.//American Society for Nondestructive Testing "" American Society for Nondestructive Testing 1986 1986 1999-05-19 07:17:37 +0900 2025-11-06 11:47:22 +0900 volume text unknown English 9780931403019 "" BA0065124X 2 2nd ed. xxiii, 677 p. ; 25 cm 1 677 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" 71230 Nondestructive testing handbook "" "" "" "" v. 4 "" "" 30675 18169 "" 2024-11-28 22:00:39 +0900 2025-11-28 13:05:58 +0900 "" "" "" "" "" "" 30948 200610 620.179|M|8228 sengen S10070205 1988-02-23 00:00:00 +0900 2010-12-15 22:48:53 +0900 2025-11-06 11:47:22 +0900