manifestation_id original_title title_alternative title_transcription statement_of_responsibility manifestation_identifier creator contributor publisher date_of_publication pub_date year_of_publication publication_place manifestation_created_at manifestation_updated_at carrier_type content_type frequency language isbn issn doi jpno ncid lccn iss_itemno volume_number volume_number_string edition edition_string issue_number issue_number_string serial_number extent start_page end_page dimensions height width depth manifestation_price access_address manifestation_required_role abstract description identifier:unknown identifier:nbn identifier:isbn10 identifier:iss_itemno identifier:online_isbn identifier:print_isbn identifier:print_issn identifier:online_issn identifier:escidoc identifier:nims series_statement_id series_statement_original_title series_statement_title_subseries series_statement_title_subseries_transcription series_statement_title_transcription series_statement_creator series_statement_volume_number series_statement_series_master series_statement_root_manifestation_id series_statement_manifestation_id series_statement_position series_statement_note series_statement_created_at series_statement_updated_at subject:ndlsh subject:unknown subject:bsh classification:ndc8 classification:ndc9 classification:udc item_id item_identifier binding_item_identifier call_number library shelf item_note accepted_at acquired_at item_created_at item_updated_at 66013 Scanning electron microscopy : physics of image formation and microanalysis Ludwig Reimer 68074 Reimer, Ludwig "" Springer 1998 1998 2002-06-21 22:35:47 +0900 2025-12-15 09:44:27 +0900 volume text unknown English 9783540639763 03424111 BA37992011 : hardcover 2 2nd completely revised and updated ed xiv, 527 p. ; 25 cm 1 527 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" 69427 Springer series in optical sciences "" "" "" "" v. 45 "" "" 66013 16382 "" 2024-11-28 21:36:38 +0900 2025-11-28 13:04:07 +0900 "" "" "" "" "" 621.385.833 42154 219240 621.385.833|R|11733 namiki N00220402 2002-07-18 00:00:00 +0900 2010-12-15 23:44:59 +0900 2025-12-15 09:44:27 +0900 5098 Scanning electron microscopy : an international review of advances in biological techniques and applications of the scanning electron microscope An international review of advances in instrumentation, techniques, theory and physical applications of the scannig electron microscope//An international review of advances in techniques and applications of the scanning electron microscope Scanning Electron Microscopy.1979/Ⅱ (An International Review of Advances in Techniques&Applications of the Scanning Electron Microscope.) edited by Robert P. Becker and Om Johari 63735 Becker, Robert P.//Johari, Om "" Scanning Electron Microscopy 1979 1979 2000-12-26 03:54:19 +0900 2025-12-15 09:44:21 +0900 volume text unknown English 9780931288050 "" BA0855001X 1979 1979, pt 2 1 v. ; 29 cm 1 910 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385 5510 527875 621.385||04239 namiki N00220304 1980-12-23 00:00:00 +0900 2010-12-15 20:40:28 +0900 2025-12-15 09:44:21 +0900 5097 Scanning Electron Microscopy. 1979/1 (An International Review of Advances in Techniques & Applications of the Scanning Electron Microscope.) "" Scanning Electron Microscopy.1979/1 (An International Review of Advances in Techniques&Applications of the Scanning Electron Microscope.) 63734 "" "" Scanning Electron Microscopy.Inc.' 1979-01-01 00:00:00 +0900 1979-01-01 1979 2000-12-26 03:54:17 +0900 2025-12-15 09:44:19 +0900 volume text unknown English 9780931288005 05865581 598p; 28cm 1 598 28.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385 5509 527876 621.385||04238 namiki N00220304 "" 1980-12-23 00:00:00 +0900 2010-12-15 20:40:27 +0900 2025-12-15 09:44:19 +0900 4563 Springer Series in Optical Sciences Volume 45 (Scanning Electron Microscopy) Springer Series in Optical Sciences Volume 45 (Scanning Electron Microscopy) 64872 Reimer.L.' "" Springer 1998-01-01 00:00:00 +0900 1998-01-01 1998 2000-12-26 03:42:50 +0900 2025-12-15 09:44:22 +0900 volume text unknown English "" "" 527p; 24cm 1 527 24.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 4901 527891 621.385.||05395 namiki N00220304 1998-11-13 00:00:00 +0900 2010-12-15 20:37:06 +0900 2025-12-15 09:44:22 +0900 3344 Practical scanning electron microscopy : electron and ion microprobe analysis edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart 62913 Goldstein, Joseph//Yakowitz, Harvey "" Plenum Press 1975 1975 2000-12-26 03:25:06 +0900 2025-12-15 09:44:24 +0900 volume text unknown English 9780306308208 "" BA03242622 xviii, 582 p. ; 24 cm 1 582 23.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 3604 527900 621.385.||03410 namiki N00220305 1976-02-24 00:00:00 +0900 2010-12-15 20:30:31 +0900 2025-12-15 09:44:24 +0900 2570 Advanced scanning electron microscopy and X-ray microanalysis Advanced Scanning Electron Microscopy and X-Ray Microanalysis Dale E. Newbury ... [et al.] 64857 Newbury, Dale E. "" Plenum Press 1986 1986 2000-12-26 03:17:36 +0900 2025-12-15 09:44:27 +0900 volume text unknown English "" "" BA00238640 xii, 454 p. ; 24 cm 1 454 23.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 2736 527868 621.385.||05379 namiki N00220402 1998-09-01 00:00:00 +0900 2010-12-15 20:26:27 +0900 2025-12-15 09:44:27 +0900 574 Scanning electron microscopy : applications to materials and device science [by] P.R. Thornton 60377 Thornton, P. R. "" Chapman & Hall 1968 1968 2000-12-26 02:59:30 +0900 2025-12-15 09:44:16 +0900 volume text unknown English "" "" BA07410809 iii-xv, 368 p. ; 22 cm 1 368 22.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.38 594 527907 621.38||00891 namiki N00220302 1968-09-24 00:00:00 +0900 2010-12-15 20:14:55 +0900 2025-12-15 09:44:16 +0900 30052 Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists "" Joseph I. Goldstein ... [et al.] 33688 Goldstein, Joseph, "" Plenum Press 1992 1992 1901-12-31 09:00:00 +0900 2026-01-14 09:29:54 +0900 volume text unknown English 9780306441752 "" BA18374139 2 2nd ed xviii, 820 p. ; 26 cm 1 820 0.0 0.0 0.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 41965 217474 621.385.833|G|10373 namiki N00220305 "" 1997-08-05 00:00:00 +0900 2010-12-15 23:44:06 +0900 2026-01-14 09:29:54 +0900 42080 Scanning electron microscopy/1976 SEM 25830 Johari, Om//IIT Research Institute//Becker, Robert P. edited by Om Johari IIT Research Institute 1976 1976 1901-01-01 09:00:00 +0900 2025-12-15 09:44:27 +0900 volume text unknown English 9780915802098 05865581 BA72401893 1 Vol. 1 1 v. ; 29 cm 1 782 29.0 Guest "" "" "" "" "" "" "" "" "" "" 22296 Scanning electron microscopy "" "" "" "" "" "" "" 42080 977 "" 2012-02-02 10:20:33 +0900 2025-07-11 15:05:59 +0900 "" "" "" "" "" 621.385.833 43684 205652 621.385.|Ｊ|5851 namiki N00220402 1977-02-10 00:00:00 +0900 2010-12-15 23:52:10 +0900 2025-12-15 09:44:27 +0900 42081 Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois SEM edited by Om Johari ; sponsored by IIT research Institute 25832 Scanning Electron Microscope Symposium//Johari, Om//IIT Research Institute edited by Om Johari IIT Research Institute 1977 1901-01-01 09:00:00 +0900 2025-12-15 09:44:28 +0900 volume text unknown English 9780915802111 "" BA22283161 1 Vol. 1 xvi, 783 p. ; 29 cm 1 784 28.0 Guest "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" 621.385.833 43685 205654 621.385.|J|6184 namiki N00220402 1978-05-29 00:00:00 +0900 2010-12-15 23:52:11 +0900 2025-12-15 09:44:28 +0900