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34839	Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan		  	Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter ... [et al.] ; published by SPIE--The International Society for Optical Engineering	921143	International Symposium on Polarization Analysis and Applications to Device Technology//Yoshizawa, Tōru//Yokota, Hideshi//Society of Photo-optical Instrumentation Engineers. Japan Chapter//Society of Photo-optical Instrumentation Engineers	""	SPIE		1996	1996		2008-09-04 01:47:34 +0900	2025-12-15 09:28:53 +0900	volume	text	unknown	English	9780819422712	""			BC06824243										xiii, 350 p. ; 28 cm	1	350		28.0					Guest			""	""	""	""	""	""	""	""	""	""	66750	Proceedings / SPIE -- the International Society for Optical Engineering	""	""	""	""	v. 2873	""	""	34839	13742	""	2024-11-28 21:07:49 +0900	2025-11-28 13:04:07 +0900	""	""	""	""	""	535.5	76496	211081		535.5|Y|ｷ 1599	namiki	N00080203			2008-03-05 00:00:00 +0900	2010-12-16 02:42:39 +0900	2025-12-15 09:28:53 +0900