manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	serial	manifestation_identifier	creator	contributor	publisher	date_of_publication	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	ncid	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	doi	jpno	ncid	lccn	iss_itemno	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
65882	材料評価のための分析電子顕微鏡法		ザイリョウ ヒョウカ ノ タメ ノ ブンセキ デンシ ケンビキョウ ホウ  			35983	進藤大輔, 及川哲夫	""	共立出版	1999-01-01 00:00:00 +0900	1999		2000-06-02 20:07:22 +0900	2017-09-08 15:04:44 +0900	volume	text	unknown	Japanese	9784320085244	""									182p; 26cm	1	182		26.0			3890		Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	620.187						39653	218378		620.187|S|11112	sengen	S00100205			2000-06-30 00:00:00 +0900	2010-12-15 23:33:13 +0900	2017-09-08 15:04:44 +0900
32584	Metallurgical Applications of The Scanning Electron Microscope		Metallurgical Applications of The Scanning Electron Microscope  			24125	BISRA	""	日本技術調査	1993-01-01 00:00:00 +0900			1999-05-19 07:47:57 +0900	2011-03-31 18:22:22 +0900	volume	text	unknown	English	""	""									18p; 25cm	1	18		25.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	620.187						33176	203940		620.187|Ｍｅ|	sengen	S00100205			1970-11-25 00:00:00 +0900	2010-12-15 23:01:01 +0900	2010-12-15 23:01:01 +0900
66317	Intermediate Voltage Microscopy and Its Application to Materials Science		  			31868	editor, Krishna Rajan	""	Electron Optics Publishing Group Philips Electronic Instruments, Inc.	1987-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2011-06-14 16:36:33 +0900	volume	text	unknown	English	""	""									143p; 28cm	1	143		28.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	620.187						44154	215623		620.187|R|T-1304	sengen	S00100205			1991-03-20 00:00:00 +0900	2010-12-15 23:54:47 +0900	2010-12-15 23:54:47 +0900
41035	A Study on Ductile Fracture: Proedschrift: Ter verkrijging van de graad van doctor in de technische wetenschappen aan de technische hogeschool deift, op gezag van de rector magnificus ir. h. r. van nauta lemke, hoogleraar in de afdeling der elektrotechniek, voor een commissie uit de senaat te verdigen op woensdag 10 februari 1971 te 14 uur		  			25281	David Broek	""	Nederlandse Boekdruk Industrie N. V.	1971-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2011-08-01 05:55:33 +0900	volume	text	unknown	English	""	""									114p; 23cm	1	114		23.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	620.187						42467	205101		620.187|B|4339	sengen	S10660304			1971-08-03 00:00:00 +0900	2010-12-15 23:46:27 +0900	2011-08-01 05:55:33 +0900