[M] Practical scanning electron microscopy : electron and ion microprobe analysis

edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart
Creator: Goldstein, Joseph Yakowitz, Harvey Contributor: edited by Joseph I. Goldstein, Harvey Yakowitz Publisher: Plenum Press

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Form:	Volume
Language:	English
Physical description:	xviii, 582 p. ; 24 cm
Subject:
Classification:
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Identifier:	NCID: BA03242622
Abstract:
Note:	Includes bibliographical references and index

Item identifier	Library	Shelf	Call number	Circulation status
209197	Sengen	Books 11	621.385.833|Ｇ|5796	Available On Shelf

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