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1 Electron microscope specimen preparation techniques in materials science Volume
Item identifier Library Shelf Call number Circulation status
600501 Sengen Books 11 Picture 621.385.833|M|5 Available On Shelf
2 Electron diffraction in the electron microscope Volume
Item identifier Library Shelf Call number Circulation status
600500 Sengen Books 11 Picture 621.385.833|M|2 Available On Shelf
3 The operation and calibration of the electron microscope Volume
Item identifier Library Shelf Call number Circulation status
600499 Sengen Books 11 Picture 621.385.833|M|1 Available On Shelf
4 Practical Scanning Electron Microscopy. Volume
Item identifier Library Shelf Call number Circulation status
527900 Namiki Books 16 Picture 621.385.||03410 Available On Shelf
5 The Chemical Applications of Transmission Electron Microscopy. Volume
Item identifier Library Shelf Call number Circulation status
527901 Namiki Books 16 Picture 621.385.||04167 Available On Shelf
6 Developments in Electron Microscopy and Analysis. Volume
Item identifier Library Shelf Call number Circulation status
205663 Sengen Books 11 Picture 621.385.833|Ｖ|5861 Available On Shelf
7 走査電子顕微鏡：基礎と応用 Volume
Item identifier Library Shelf Call number Circulation status
215628 Sengen Books 11 Picture 621.385.833|N|T-66 Available On Shelf
8 Principles and Practice of Electron Microscope Operation Vol.2 Vol.2 Volume
Item identifier Library Shelf Call number Circulation status
205648 Sengen Books 11 Picture 621.385.833|G|6497 Available On Shelf
9 Scanning Electron Microscopy/ 1976/ 1 : Proceedings of the Part 1 9th Annual Scanning Electron Microscope Symposium / Part 2 Physical Applications of the Scanning Transmission Electron Miroscope / Part 3 Techniques for ParticulateMatter Studies in the Scanning Electron Microscope / Part 4 Microelectronic Device Fabrication and Quality Control with the Scanning Electron Microscope April 5-9, 1976 Volume
Item identifier Library Shelf Call number Circulation status
205652 Sengen Books 11 Picture 621.385.|Ｊ|5851 Available On Shelf
10 Physical Aspects of Electron Microscopy and Microbeam Analysis: Jointly sponsored by the Electron Microscopy Society of America and the Microbeam Analysis Society Volume
Item identifier Library Shelf Call number Circulation status
205664 Sengen Books 11 Picture 621.385.833|S|5820 Available On Shelf

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