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11 records found from 103569 records in 0.062 seconds.
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1 |
Journal of Electron Microscopy
ISSN: 00220744
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Atom Probe Field Ion Microscopy
M.K. Miller , A. Cerezo , M.G. Hetherington , G.D.W. Smith
Clarendon Press Oxford Science Publications
UDC: 539.24
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Electric Conduction in Semiconductors and Metals
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Lectures on the Electrical Properties of Materials
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Magnetic Critical Scattering
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Metal and Ceramic Matrix Composites : An Oxford-Kobe Materials Text {Series in Materials Science and Engineering}
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Numerical Analysis and Optimization : An Introduction to Mathematical Modelling and Numerical Simulation
Oxford University Press USA
(2007)
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Properties of Materials : Anisotropy, Symmetry, Structure
Oxford University Press USA
(2005)
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Simple Models of Magnetism Texts
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The Shorter Oxford English Dictionary.
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