[M] In situ high-temperature X-ray observation of crystallization during the fabricationof non-silica(20ZnO'80Te02)glass-preform of optical devices

Creator: NUKUI Akihiko TODOROKI Shin-ichi MIYATA Masaaki BANDO Yoshio (Date of publication: 2001)
https://hdl.handle.net/20.500.11932/611563

Manifestation: In situ high-temperature X-ray observation of crystallization during the fabricationof non-silica(20ZnO'80Te02)glass-preform of optical devices

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Created at: Mon, 31 Jul 2023 14:52:12 +0900

Updated at: Mon, 31 Jul 2023 14:52:12 +0900