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Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials
Creator: American Society for Testing and Materials. Subcommittee II on Fractography Publisher: American Society for Testing and Materials (Date of publication: 1969)
Manifestation: Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials
Checkout type: 標準
Circulation status: Available On Shelf
Call number: 539||02368
Register number:
Item identifier: 525017
Include supplements: No
Required role: Guest
Acquired at: February 02, 1973
Note:
Accepted at:
Created at: Wed, 15 Dec 2010 20:19:32 +0900
Updated at: Mon, 15 Dec 2025 09:31:18 +0900