[M] Physical measurement and analysis of thin films

edited by E. M. Murt and W. G. Guldner
Creator: Eastern Analytical Symposium Murt, E. M. Guldner, W. G. Publisher: Plenum Press (Date of publication: 1969)

Manifestation: Physical measurement and analysis of thin films

Shelf: Books 14 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 543|Ｍ|

Register number:

Item identifier: 202463

Include supplements: No

Required role: Guest

Acquired at: April 01, 1969

Note:

Accepted at:

Created at: Wed, 15 Dec 2010 22:56:54 +0900

Updated at: Mon, 15 Dec 2025 09:35:42 +0900