[M] Magnitnye Metody Defektoskopii Analiza I Izmerenii

Creator: Yanus R. I. Publisher: Svrdlovsk (Date of publication: 1959-01-01)

Manifestation: Magnitnye Metody Defektoskopii Analiza I Izmerenii

Shelf: Books 20 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 620.179.|Ｍａ|１

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Item identifier: 203916

Include supplements: No

Required role: Guest

Acquired at: June 07, 1965

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Accepted at:

Created at: Wed, 15 Dec 2010 23:00:51 +0900

Updated at: Mon, 15 Dec 2025 09:41:35 +0900