[M] Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970

著者: Symposium on Applications of Electron Microfractography to Materials Research American Society for Testing and Materials. Subcommittee II on Fractography 出版者: American Society for Testing and Materials (出版日: 1971)

資料: Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970

本棚: その他 (千現)

貸出区分: 標準

貸出状態: 除籍済み

請求記号: STP|A|5172

原簿番号:

所蔵情報ID: 209905

付録を含む: いいえ

閲覧に必要な権限: Guest

受入日: 1974年03月22日

業務用メモ:

受入時刻:

作成時刻: 2010/12/15 23:16:28

更新時刻: 2025/05/12 09:55:15