Showing Item

[M] Fatigue crack growth under spectrum loads : a symposium presented at the Seventy-eighth Annual Meeting, American Society for Testing and Materials, Montreal, Canada, 23-24 June, 1975, R. P. Wei and R. I. Stephens, symposium cochairmen Volume


Creator: Publisher: ASTM (Date of publication: 1976)

Manifestation: Fatigue crack growth under spectrum loads : a symposium presented at the Seventy-eighth Annual Meeting, American Society for Testing and Materials, Montreal, Canada, 23-24 June, 1975, R. P. Wei and R. I. Stephens, symposium cochairmen

Shelf: Stack 12 Picture (Sengen)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: STP|A|キ397

Register number:

Item identifier: 212652

Include supplements: No

Required role: Guest

Acquired at: December 14, 1992

Note:

Accepted at:

Created at: Wed, 15 Dec 2010 23:20:02 +0900

Updated at: Tue, 23 Dec 2025 15:16:03 +0900