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Advances in X-ray analysis v. 32
edited by Charles S. Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data
Creator: Conference on Application of X-ray Analysis Denver Research Institute JCPDS-International Centre for Diffraction Data Barrett, C. S. (Charles Sanborn) Publisher: Plenum (Date of publication: 1989)
Manifestation: Advances in X-ray analysis
Checkout type: 標準
Circulation status: Available On Shelf
Call number: 539|A|T-1235
Register number:
Item identifier: 215889
Include supplements: No
Required role: Guest
Acquired at: March 28, 1990
Note:
Accepted at:
Created at: Wed, 15 Dec 2010 23:23:07 +0900
Updated at: Mon, 15 Dec 2025 09:31:17 +0900