[M] Advances in X-ray analysis v. 36

edited by John V. Gilfrich ... [et al.] ; sponsored by University of Denver Department of Engineering and International Centre for Diffraction Data
Creator: Conference on Application of X-ray Analysis Denver Research Institute JCPDS-International Centre for Diffraction Data Gilfrich, John V. Publisher: Plenum (Date of publication: 1993)

Manifestation: Advances in X-ray analysis

Shelf: Books 10 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 539|Ａ|9882

Register number:

Item identifier: 216890

Include supplements: No

Required role: Guest

Acquired at: February 28, 1996

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Accepted at:

Created at: Wed, 15 Dec 2010 23:26:03 +0900

Updated at: Mon, 15 Dec 2025 09:31:17 +0900