[M] Advances in X-ray analysis v. 37

edited by John V. Gilfrich ... [et al.] ; sponsored by University of Denver Department of Engineering and International Centre for Diffraction Data
Creator: Conference on Application of X-ray Analysis Denver Research Institute JCPDS-International Centre for Diffraction Data Gilfrich, John V. Publisher: Plenum (Date of publication: 1994)

Manifestation: Advances in X-ray analysis

Shelf: Books 10 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 539|Ａ|9883

Register number:

Item identifier: 216891

Include supplements: No

Required role: Guest

Acquired at: March 05, 1996

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Created at: Wed, 15 Dec 2010 23:26:04 +0900

Updated at: Mon, 15 Dec 2025 09:31:18 +0900