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[M] Measurement of residual and applied stress using neutron diffraction Volume

edited by Michael T. Hutchings and Aaron D. Krawitz
Creator: Publisher: Kluwer Academic (Date of publication: 1992)

Manifestation: Measurement of residual and applied stress using neutron diffraction

Shelf: Books 20 Picture (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 620.179|H|10085

Register number:

Item identifier: 217174

Include supplements: No

Required role: Guest

Acquired at: March 10, 1997

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Accepted at:

Created at: Wed, 15 Dec 2010 23:33:41 +0900

Updated at: Mon, 15 Dec 2025 09:41:28 +0900