[M] Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 pt. 2

edited by Masashi Suezawa and Hiroshi Katayama-Yoshida
Creator: International Conference on Defects in Semiconductors Suezawa, Masashi Katayama-Yoshida, Hiroshi Contributor: edited by;Masashi Suezawa and Hiroshi Katayama-Yoshida Publisher: Trans Tech Publications (Date of publication: 1995)

Manifestation: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 pt. 2

Shelf: Books 22 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 621.315.|D|ｷ1198

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Item identifier: 219284

Include supplements: No

Required role: Guest

Acquired at: July 08, 2002

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Created at: Wed, 15 Dec 2010 23:46:13 +0900

Updated at: Mon, 15 Dec 2025 09:43:47 +0900