[M] Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials

Creator: American Society for Testing and Materials. Subcommittee II on Fractography Publisher: American Society for Testing and Materials (Date of publication: 1969)

Manifestation: Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials

Shelf: Other (Sengen)

Checkout type: 標準

Circulation status: Removed

Call number: ASTM|A|T-142

Register number:

Item identifier: 215555

Include supplements: No

Required role: Guest

Acquired at: December 02, 1972

Note:

Accepted at:

Created at: Wed, 15 Dec 2010 23:57:15 +0900

Updated at: Mon, 12 May 2025 09:55:15 +0900