[M] Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.

editors, M. Selim Ünlü ... [et al.]
Creator: Ünlü, M. Selim Symposium on Optical Microstructural Characterization of Semiconductors Publisher: Materials Research Society (Date of publication: 2000)

Manifestation: Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.

Shelf: Journal Archives 60 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: MRS|P|588

Register number:

Item identifier: 218790

Include supplements: No

Required role: Guest

Acquired at: May 31, 2001

Note:

Accepted at:

Created at: Thu, 16 Dec 2010 00:00:03 +0900

Updated at: Wed, 03 Dec 2025 16:34:37 +0900