[M] Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 2

Creator: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Contributor: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Publisher: Trans Tech Publications

Manifestation: Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 2

Shelf: Stack 6 (Sengen)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: |M|ｷ 927

Register number:

Item identifier: 124216

Include supplements: No

Required role: Guest

Acquired at: December 10, 1999

Note:

Accepted at:

Created at: Thu, 16 Dec 2010 01:57:04 +0900

Updated at: Tue, 26 Jun 2012 17:08:51 +0900